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An atom probe tomography study of grain boundary segregation in nanocrystalline Ni-W

Published online by Cambridge University Press:  26 February 2011

Andrew Detor ,
Michael K. Miller  and
Christopher A. Schuh
Andrew Detor
Affiliation:
detora@mit.edu, Massachusetts Institute of Technology, 77 Massachusetts Ave., Room 8-006, Cambridge, MA, 02139, United States
Michael K. Miller
Affiliation:
millermk@ornl.gov
Christopher A. Schuh
Affiliation:
schuh@mit.edu
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Abstract

Atom probe tomography is used to observe the solute distribution in electrodeposited nanocrystalline Ni-W alloys with three different grain sizes (3, 10, and 20 nm) and the results are compared with atomistic computer simulations. The presence of grain boundary segregation is confirmed by detailed analysis of composition fluctuations in both experimental and simulated structures, and its extent quantified by a frequency distribution analysis. In contrast to other nanocrystalline alloys, the present Ni-W alloys exhibit only a subtle amount of solute segregation to the intergranular regions. This finding is consistent with quantitative predictions for these alloys based upon a thermodynamic model of grain boundary segregation.

Keywords

nanostructureelectrodepositiongrain boundaries
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 903: Symposium Z – Amorphous and Nanocrystalline Metals for Structural Applications , 2005 , 0903-Z03-01
Copyright
Copyright © Materials Research Society 2006

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