In this paper we examine a recently proposed concept for obtaining sub-pixel spatial resolution in compound semiconductors where hole transport properties are relatively poor.  This approach uses weighted sums and differences of local pixel signals to extract both accurate x-ray energy estimates and interpolate location at the sub-pixel level. A simple analysis, including noise estimates, suggests the possibility of obtaining locations at the 50–100 micron level using 1–2 mm wide stripe electrodes while obtaining 1–2% energy resolution for x-rays up to 100 keV. Following this examination, we will present the most recent experimental results from our program to develop electronics to implement this scheme.
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