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Amorphous Interface Between Crystalline Nickel and Titanium Films

  • F.J. Walker (a1), R.A. Mckee (a1) and F.A. List (a1)

Abstract

Using in situ reflection high energy electron diffraction and x-ray diffraction, the structure and composition of nickel and titanium multilayer films have been studied. The films were evaporated under UHV conditions at rates of.01 to.1 nm/sec. When deposited on an amorphous NiTi film at 70°C, the individual layers of nickel or titanium are polycrystalline and textured with the close-packed planes perpendicular to the growth direction. The interface between the layers is amorphous and about 2 nm thick. X-ray scattering from the crystalline layers indirectly shows the composition of the amorphous interface to be Ni rich.

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7. Alexander, K. B., Walker, F. J., McKee, R. A., and List, F. A., to be published.

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Amorphous Interface Between Crystalline Nickel and Titanium Films

  • F.J. Walker (a1), R.A. Mckee (a1) and F.A. List (a1)

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