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Activation volume analysis of plastic deformation in fcc materials using nanoindentation

Published online by Cambridge University Press:  11 February 2011

A. A. Elmustafa ,
M. F. Tambwe  and
D. S. Stone
A. A. Elmustafa*
Affiliation:
NASA Langley Research Center- ConITS, Hampton, VA, USA
M. F. Tambwe
Affiliation:
Intel Corporation, Portland, OR, USA
D. S. Stone
Affiliation:
Department of Materials Science & Engineering, University of Wisconsin-Madison, Madison, WI, USA
*
* Corresponding author.
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Abstract

Activation volumes for plastic deformation of fcc metals are measured using nanoindentation. Materials include bulk, polycrystalline aluminum and α-brass, and sputtered copper and nickel thin films on silicon substrates. From a hardness measurement, V* is defined as 9kBT/∂H/∂ln , where H is the hardness and is a representative strain rate beneath the indenter. Data obtained using nanoindentation are consistent with those obtained using more conventional experiments based on uniaxial loading.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 750: Symposium Y – Surface Engineering 2002–Synthesis, Characterization and Applications , 2002 , Y8.14
Copyright
Copyright © Materials Research Society 2003

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References

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