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Accurate Light Absorption Profile in Tandem A-SI:H Solar Cells on Textured TCO Substrates

Published online by Cambridge University Press:  16 February 2011

G. Tao
Affiliation:
Delft University of Technology, P.O. Box 5031, 2600 GA Delft, the Netherlands
Zs. Makaro
Affiliation:
Delft University of Technology, P.O. Box 5031, 2600 GA Delft, the Netherlands
M. Zeman
Affiliation:
Delft University of Technology, P.O. Box 5031, 2600 GA Delft, the Netherlands
J.W. Metselaar
Affiliation:
Delft University of Technology, P.O. Box 5031, 2600 GA Delft, the Netherlands
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Abstract

While a-Si:H tandem solar cells deposited on textured TCO substrates have already shown high efficiency and good stability [1], the light absorption profile in such cells is still one of the important quantities to know. An accurate absorption profile is required when we do solar cell analysis, design, and optimization, or when we do computer simulations.

With the computer program GENPRO2D [2] which was developed in our laboratory, and was based on the incoherent Multi-rough-interfaces (scattering) Model, we are able to calculate the light absorption profile in a tandem a-Si:H solar cell for different light spectra and different light incident angles, provided that the scattering of light at every interface in the cell is known. In this paper, we will present our calculated results with comparison to the measured results of a real tandem cell.

Type
Research Article
Copyright
Copyright © Materials Research Society 1994

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References

REFERENCES

1. Schropp, R.E.I., in: the proceedings of First Euregional Workshop on Amorphous Silicon Solar Cell Development, Utrecht, NL, February, 1994.Google Scholar
2. Tao, G., Zeman, M. and Metselaar, J.W., in: The Technical Digest of PVSEC-7, Nagoya, Japan, (1993). pp. 1314; Another More detailed paper to be published in: Solar Energy Materials and Solar Cells, (1994).Google Scholar
3. Tsuge, S., Hishikawa, Y., Nakamura, N., Tsuda, S., Nakano, S., Kishi, Y., and Kuwano, Y., The Technical Digest of PVSEC-5, Kyoto, Japan, 1990, pp. 261264.Google Scholar
4. Hulstrom, R., Bird, R. and Riordan, C., Spectral solar irradiance data sets for selected terrestrial condition. Solar Cells, 15 (1985), pp365391.Google Scholar
5. Bennett, J.M. and Mattsson, L., Introduction to Surface Roughness and Scattering, Optical Society of America, Washington, D.C., 1989.Google Scholar
6. Schade, H. and Smith, Z.E.: “Mie scattering and rough surfaces”, Applied Optics, Vol. 24, No. 19, (1985), pp. 32213226.Google Scholar
7. Leblanc, F., Perrin, J., and Cornil, E., in: J. of Non-crystalline solids, 137 & 138 (1991), pp. 11651168.Google Scholar
8. Yang, Liyou, Chen, L., Wiedenman, S. and Catalano, A., in: Mater. Res. Soc. Proc. Vol. 283, (1993), Materials Research Society, pp. 463470.Google Scholar