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Vector Magneto-Optical Generalized Ellipsometry on Passivated Permalloy Slanted Columnar Thin Films

Published online by Cambridge University Press:  11 January 2012

Daniel Schmidt
Affiliation:
Department of Electrical Engineering and Center for Nanohybrid Functional Materials, University of Nebraska-Lincoln, Lincoln, NE 68588, U.S.A.
Chad Briley
Affiliation:
Department of Electrical Engineering and Center for Nanohybrid Functional Materials, University of Nebraska-Lincoln, Lincoln, NE 68588, U.S.A.
Eva Schubert
Affiliation:
Department of Electrical Engineering and Center for Nanohybrid Functional Materials, University of Nebraska-Lincoln, Lincoln, NE 68588, U.S.A.
Mathias Schubert
Affiliation:
Department of Electrical Engineering and Center for Nanohybrid Functional Materials, University of Nebraska-Lincoln, Lincoln, NE 68588, U.S.A.
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Abstract

Vector magneto-optical generalized ellipsometry on passivated ferromagnetic permalloy slanted columnar thin films is reported. The nanostructured thin film was grown by electron-beam glancing angle deposition and subsequently coated with a thin Al2O3 layer by atomic layer deposition. Magneto-optical generalized ellipsometry data have been acquired while an external magnetic field H with constant amplitude was rotated with respect to the sample (spatial hysteresis loops). The magneto-optical coupling parameters, which are proportional to the sample magnetization M, reveal intriguing anisotropic magnetic behavior of the slanted columnar thin film. Three-dimensional graphs of the magneto-optical coupling parameters with respect to spatial hysteresis loops shown here are representative for the sample magnetization.

Type
Research Article
Copyright
Copyright © Materials Research Society 2012

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