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Transmission electron microscopy analysis of secondary phases in Cu2ZnSnS4 thin film solar cells

Published online by Cambridge University Press:  28 July 2014


Wei Li
Affiliation:
School of Photovoltaic and Renewable Energy Engineering, University of New South Wales, Sydney, NSW 2052, Australia
Ziheng Liu
Affiliation:
School of Photovoltaic and Renewable Energy Engineering, University of New South Wales, Sydney, NSW 2052, Australia
Jian Chen
Affiliation:
School of Photovoltaic and Renewable Energy Engineering, University of New South Wales, Sydney, NSW 2052, Australia
Fangyang Liu
Affiliation:
School of Photovoltaic and Renewable Energy Engineering, University of New South Wales, Sydney, NSW 2052, Australia
Xiaojing Hao
Affiliation:
School of Photovoltaic and Renewable Energy Engineering, University of New South Wales, Sydney, NSW 2052, Australia
Corresponding
E-mail address:

Abstract

Secondary phases are likely to occur in the Cu2ZnSnS4 (CZTS) films since the CZTS is thermodynamically stable in only a narrow region of the phase diagram. The CZTS solar cell performance can be influenced by the existence and precipitated position of secondary phases. Therefore, locally investigate the distribution of secondary phases is important to further improve CZTS solar cell efficiency. In this study, two different kinds of transmission electron microscopy imaging techniques, bright field scanning TEM image (BF-STEM) and High-angle annular dark-field (HAADF) image, are applied to analyze the distribution of secondary phases. Due to the atomic number differences between CZTS and secondary phases, secondary phases are evident in the HAADF images. Therefore, HAADF image is a more powerful and convenient method to analyze the secondary phases than the BF-STEM image.


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Articles
Copyright
Copyright © Materials Research Society 2014 

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