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Synthesis, Analysis, Transport and Field emission Measurements of Compound B-C-N Nanotubes

Published online by Cambridge University Press:  15 February 2011

Dmitri Golberg*
Affiliation:
Advanced Materials Laboratory and Nanomaterials Laboratory, National Institute for Materials Science, Namiki 1-1, Tsukuba, Ibaraki 305-0044, Japan
Yoshio Bando
Affiliation:
Advanced Materials Laboratory and Nanomaterials Laboratory, National Institute for Materials Science, Namiki 1-1, Tsukuba, Ibaraki 305-0044, Japan
Pavel Dorozhkin
Affiliation:
Advanced Materials Laboratory and Nanomaterials Laboratory, National Institute for Materials Science, Namiki 1-1, Tsukuba, Ibaraki 305-0044, Japan
Zhen-Chao Dong
Affiliation:
Advanced Materials Laboratory and Nanomaterials Laboratory, National Institute for Materials Science, Namiki 1-1, Tsukuba, Ibaraki 305-0044, Japan
Cheng-Chun Tang
Affiliation:
Advanced Materials Laboratory and Nanomaterials Laboratory, National Institute for Materials Science, Namiki 1-1, Tsukuba, Ibaraki 305-0044, Japan
Keiji Kurashima
Affiliation:
Advanced Materials Laboratory and Nanomaterials Laboratory, National Institute for Materials Science, Namiki 1-1, Tsukuba, Ibaraki 305-0044, Japan
Masanori Mitome
Affiliation:
Advanced Materials Laboratory and Nanomaterials Laboratory, National Institute for Materials Science, Namiki 1-1, Tsukuba, Ibaraki 305-0044, Japan
*
*corresponding author. E-mail: golberg.dmitri@nims.go.jp
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Abstract

Multiwalled B-C-N nanotubes of various morphologies and chemical compositions were synthesized by reacting C-based nanotube templates with boron oxide and nitrogen at 1573 K- 2173 K. The nanotubes were thoroughly analysed using a high-resolution field-emission 300 kV transmission electron microscope (TEM), an energy-filtered field-emission 300 kV electron microscope (Omega filter), an electron energy loss spectrometer and an energy dispersion X-ray detector. Transport and field emission properties of the nanotubes were studied using a low energy electron point source microscope and via in-situ measurements in TEM equipped with a scanning tunnelling microscope (STM) unit.

Type
Research Article
Copyright
Copyright © Materials Research Society 2003

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Footnotes

1

Present address:Institute of Solid State Physics,ChernogolovkaMoscow Reg. 142432, Russia

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