Hostname: page-component-848d4c4894-ndmmz Total loading time: 0 Render date: 2024-05-28T18:18:56.131Z Has data issue: false hasContentIssue false

Structural Characterization of GeSn Alloy Nanocrystals Embedded in SiO2

Published online by Cambridge University Press:  31 January 2011

Swanee J. Shin
Affiliation:
swanee76@berkeley.edu, United States
Julian Guzman
Affiliation:
julianguzman@berkeley.edu, UC Berkeley, MSE Dept., Berkeley, California, United States
Chun-Wei Yuan
Affiliation:
world21@berkeley.edu, UC Berkeley, MSE Dept., Berkeley, California, United States
Christopher Y. Liao
Affiliation:
cyliao@lbl.gov, UC Berkeley, MSE Dept., Berkeley, California, United States
Peter Stone
Affiliation:
prstone@berkeley.edu, UC Berkeley, MSE Dept., Berkeley, California, United States
Oscar D. Dubon
Affiliation:
oddubon@berkeley.edu, UC Berkeley, MSE Dept., Berkeley, California, United States
Andrew M. Minor
Affiliation:
aminor@berkeley.edu, UC Berkeley, MSE Dept., Berkeley, California, United States
Masashi Watanabe
Affiliation:
mwatanabe@lbl.gov, Lawrence Berkeley National Laboratory, Materials Sciences Division, Berkeley, California, United States
Joel Ager III
Affiliation:
JWAger@lbl.gov, Lawrence Berkeley National Laboratory, Materials Sciences Division, Berkeley, California, United States
Daryl Chrzan
Affiliation:
dcchrzan@berkeley.edu, UC Berkeley, MSE Dept., Berkeley, California, United States
Eugene Haller
Affiliation:
eehaller@lbl.gov, UC Berkeley, MSE Dept., Berkeley, California, United States
Get access

Abstract

GeSn alloy nanocrystals were formed by implantation of Ge and Sn ions into an amorphous SiO2 matrix and subsequent thermal annealing. High resolution transmission electron microscopy (HRTEM) and scanning transmission electron microscopy (STEM) with a high angle annular dark field (HAADF) detector were used to show that phase-segregated crystalline bi-lobe nanocrystals were formed. Rapid melting and solidification using a single excimer laser pulse transformed the bi-lobe structure into a homogeneously mixed amorphous structure. Raman spectroscopy was used to monitor the crystalline nature and approximate grain size of the Ge portion of the nanocrystals after each heat treatment, and the Raman spectra were compared with the TEM images.

Type
Research Article
Copyright
Copyright © Materials Research Society 2009

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Meldrum, A., Haglund, R. F., Boatner, L. A., and White, C. W., Adv. Mater. 13, 1431 (2001).Google Scholar
2. Sharp, I. D., Xu, Q., Liao, C. Y., Yi, D. O., Beeman, J. W., Liliental-Weber, Z., Yu, K. M., Zakharov, D. N., Ager, J. W. III, Chrzan, D. C., and Haller, E. E., J. Appl. Phys. 97, 124316 (2005).Google Scholar
3. Xu, Q., Sharp, I. D., Yuan, C. W., Yi, D. O., Liao, C. Y., Glaeser, A. M., Minor, A. M., Beeman, J. W., Ridgway, M. C., Kluth, P., III, J. W. A., Chrzan, D. C., and Haller, E. E., Phys. Rev. Lett. 97, 155701 (2006).Google Scholar
4. Kluth, P., Hoy, B., Johannessen, B., Dunn, S. G., Foran, G. J., and Ridgway, M. C., Appl. Phys. Lett. 89, 153118 (2006).Google Scholar
5. Strobel, M., Heinig, K.-H., and Moller, W., Nucl. Instrum. Methods Phys. Res., Sect. B 148, 104 (1999).Google Scholar
6. Yuan, C. W., Shin, S. J., Liao, C. Y., Guzman, J., Stone, P. R., Watanabe, M., Ager, J. W. III , Haller, E. E., and Chrzan, D. C., Appl. Phys. Lett. 93, 193114 (2008).Google Scholar
7. Jenkins, D. W. and Dow, J. D., Phys. Rev. B 36, 7994 (1987).Google Scholar
8. He, G. and Atwater, H. A., Phys. Rev. Lett. 79, 1937 (1997).Google Scholar
9. D’Costa, V. R., Cook, C. S., Birdwell, A. G., Littler, C. L., Canonico, M., Zollner, S., Kouvetakis, J., and Menendez, J., Phys. Rev. B 73, 125207 (2006).Google Scholar
10. Nakamura, Y., Masada, A., and Ichikawa, M., Appl. Phys. Lett. 91, 013109 (2007).Google Scholar
11. Naruse, N., Mera, Y., Nakamura, Y., Ichikawa, M., and Maeda, K., Appl. Phys. Lett. 94, 093104 (2009).Google Scholar
12. Williamson, A. J., Bostedt, C., vanBuuren, T., Willey, T. M., Terminello, L. J., Galli, G., and Pizzagalli, L., Nano Lett. 4, 1041 (2004).Google Scholar