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Structural and Morphological Study of Zirconia and Titania Sol-Gel Monolayered Films Supported on Soda-Lime Glass Substrates

Published online by Cambridge University Press:  01 February 2011

Luisa F. Cueto ,
Enrique Sánchez ,
Leticia M. Torres-Martínez  and
Gustavo A. Hirata
Luisa F. Cueto
Affiliation:
Facultad de Ciencias Químicas, División de Estudios Superiores Universidad Autónoma de Nuevo León, A.p. 1864, Monterrey N.L., México
Enrique Sánchez
Affiliation:
Facultad de Ciencias Químicas, División de Estudios Superiores Universidad Autónoma de Nuevo León, A.p. 1864, Monterrey N.L., México
Leticia M. Torres-Martínez
Affiliation:
Facultad de Ciencias Químicas, División de Estudios Superiores Universidad Autónoma de Nuevo León, A.p. 1864, Monterrey N.L., México
Gustavo A. Hirata
Affiliation:
Centro de Ciencias de la Materia Condensada Universidad Nacional Autónoma de México Km. 107 Carr. Tij.-Ens., Ensenada B.C., 22860, México
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Abstract

Sol-Gel, dip-coated titaniumIV and zirconiumIV dioxide monolayered films were deposited on soda-lime glass using titanium and zirconium acetylacetonates as precursors, respectively, and their structural and morphological characterization carried out. The films were heat-treated at different temperatures, 25°C, 150°C, 300°C, and 500°C and, according to Low-angle X-Ray Diffraction analyses (XRD), it was found that TiO2 (anatase) and tetragonal zirconia were present on the substrate, when heated at 500°C. Yoshida and Yajima's method, based on optical information given by the films transmittance UV-Vis spectra, was used to estimate film thickness, refractive index, and, using the Lorentz-Lorentz relationship, their volume fraction. Film thinning and phase formation with increasing temperature was observed, and both titania and zirconia films showed similar behavior during firing. Smooth films with a roughness value of around 2 nm are obtained for the two cases as indicated by Atomic Force Microscopy (AFM) of the surface. Also, formation temperature at around 500°C resulted in the optimum condition to obtain clean stoichiometric TiO2 and ZrO2 thin films on glass substrates as confirmed by X-Ray Photoelectron Spectroscopy (XPS) measurements.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 782: Symposium A – Micro- and Nanosystems , 2003 , A5.36
Copyright
Copyright © Materials Research Society 2004

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