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Structural and Electronic Changes in the Growth of Mercury Overlayers on Cu(001): A Helium Beam Scattering, Leed and Arpes Study

Published online by Cambridge University Press:  21 February 2011

G. Vidali ,
W. Li ,
P. A. Dowben ,
M. Karimi ,
C.W. Hutchings ,
J. Lin ,
C. Moses ,
D. Ila  and
I. Dalins
G. Vidali
Affiliation:
Syracuse University, Physics Department, Syracuse, N.Y. 13244–1130
W. Li
Affiliation:
Syracuse University, Physics Department, Syracuse, N.Y. 13244–1130
P. A. Dowben
Affiliation:
Syracuse University, Physics Department, Syracuse, N.Y. 13244–1130
M. Karimi
Affiliation:
Alabama A&M University, Physics Department, Normal, Ala.35762
C.W. Hutchings
Affiliation:
Syracuse University, Physics Department, Syracuse, N.Y. 13244–1130
J. Lin
Affiliation:
Syracuse University, Physics Department, Syracuse, N.Y. 13244–1130
C. Moses
Affiliation:
Utica College, Physics Department, Utica, N.Y. 13502
D. Ila
Affiliation:
Alabama A&M University, Physics Department, Normal, Ala.35762
I. Dalins
Affiliation:
EM-22, Marshall Space Flight Center, AL 35812
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Abstract

We used atom beam scattering (ABS), LEED and angle-resolved photo-electron spectroscopy (ARPES) to study bilayer films of Hg on Cu(001). In the surface temperature range of 180 to 330 K, the first Hg layer forms two ordered phases, a c(2×2) (with coverage=0.5 of Cu(001)) and a high density (partially commensurate) c(4×4) (coverage=0.62 ). ARPES data show that there is little or no dispersion of the 5d band of Hg. ABS data show that this layer is not flat, with in-registry Hg atoms lying about 0.15 below the not-in-registry Hg atoms. From ABS we find that the second layer forms a completely registered c(4times;4) phase. From ARPES we obtain that the second layer has an electronic structure, particularly the 5d levels, characteristic of bulk mercury.

Preliminary results of calculations of the structure of the bilayer are given.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 187: Symposium J – Thin Film Structures and Phase Stability , 1990 , 243
Copyright
Copyright © Materials Research Society 1990

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References

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