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Published online by Cambridge University Press: 31 January 2011
We have investigated the effect of post-growth rapid thermal annealing (RTA) at different temperature on two InAs/GaAs bilayer quantum dots samples with different spacer thicknesses (7.5nm and 8.5nm). It is found that when RTA temperature gradually increases, there is usual blue shift of ground state emission peak wavelength for the sample having thinner spacer but for the other sample the emission peak sustains at same peak wavelength position upto a higher annealing temperature. The dots inside the sample with less spacer thickness dissolute much earlier (beyond 700°C annealing temperature) in comparison to the other sample. The structural and optical characterization has been done by cross sectional transmission electron microscope (XTEM) and low temperature photoluminescence (PL) experiments respectively.