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Polarized Luminescence of Defects in CuGaSe2

Published online by Cambridge University Press:  01 February 2011

Susanne Siebentritt
Affiliation:
susanne.siebentritt@uni.lu, University of Luxembourg, Faculty of Science, 162a, avenue de la Faïencerie, Luxembourg, L-1511, Luxembourg
Sven Augustin
Affiliation:
augusti@physik.fu-berlin.de, Hahn-Meitner-Institute, Glienicker Str. 100, Berlin, 14109, Germany
Niklas Papathanasiou
Affiliation:
niklas.papathanasiou@hmi.de, Hahn-Meitner-Institute, Glienicker Str. 100, Berlin, 14109, Germany
Damon Hebert
Affiliation:
dhebert@uiuc.edu, University of Illinois, Dept. of Mat. Science and Engineering, Urbana, IL, 61801, United States
Angus Rockett
Affiliation:
arockett@uiuc.edu, University of Illinois, Dept. of Mat. Science and Engineering, Urbana, IL, 61801, United States
Jürgen Bläsing
Affiliation:
Juergen.Blaesing@Physik.Uni-Magdeburg.DE, Otto-von-Guericke Universität Magdeburg, Magdeburg, 39016, Germany
Martha Ch Lux-Steiner
Affiliation:
lux-steiner@hmi.de, Hahn-Meitner-Institute, Glienicker Str. 100, Berlin, 14109, Germany
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Abstract

The linear polarisation of luminescence light allows conclusions on the symmetry of defects in semiconductors with non-cubic symmetry, like chalcopyrites, for which three shallow acceptors have been identified by photoluminescence. The polarisation dependent photoluminescence allows to determine the symmetry of the defects relative to the c-axis of the crystal. A simple geometrical model implies that chalcogen sites show a predominant direction perpendicular to the c-axis, while metal sites show a predominant direction parallel to the c-axis. Since all three shallow acceptors show polarization parallel to the c-axis, it can be concluded that they are situated on a metal site

Type
Research Article
Copyright
Copyright © Materials Research Society 2007

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References

1 Feofilov, P. P., The physical basis of polarized emission (Consultants Bureau, New York, 1961).Google Scholar
2 Schulz, H.-J. and Thiede, M.. Phys. Rev. B., 1987. 35, 18.Google Scholar
3 Itskos, G., Murray, R., Meeder, A., Papathanasiou, N., and Lux-Steiner, M. C.. Appl. Phys. Lett., 2006. 89, 032108.Google Scholar
4 Domen, K., Horino, K., Kuramata, A., and Tanahashi, T.. Appl. Phys. Lett., 1997. 71, 1996.Google Scholar
5 Bawendi, M. G., Carroll, P. J., Wilson, W. L., and Brus, L. E.. Journal of Chemical Physics, 1992. 96, 946.Google Scholar
6 Kaufmann, U., Schneider, J., and Räuber, A.. Appl. Phys. Lett., 1976. 29, 312.Google Scholar
7 Bardeleben, H. J. v., Goltzene, A., and Schwab, C.. phys. stat. sol. b, 1976. 76, 363.Google Scholar
8 Birkholz, M., Kanschat, P., Weiss, T., Czerwensky, M., and Lips, K.. Phys. Rev. B, 1999. 59, 12268.Google Scholar
9 Nishi, T., Medvedkin, G. A., Katsumata, Y., Sato, K., and Miyake, H.. Jpn. J. Appl. Phys., 2001. 40, 59.Google Scholar
10 Bauknecht, A., Siebentritt, S., Albert, J., and Lux-Steiner, M. C.. J. Appl. Phys., 2001. 89, 4391.Google Scholar
11 Schuler, S., Siebentritt, S., Nishiwaki, S., Rega, N., Beckmann, J., Brehme, S., and Lux-Steiner, M. C.. Phys. Rev. B, 2004. 69, 045210.Google Scholar
12 Siebentritt, S., Beckers, I., Riemann, T., Christen, J., Hoffmann, A., and Dworzak, M.. Appl. Phys. Lett., 2005. 86, 091909.Google Scholar
13 Siebentritt, S., in Wide gap chalcopyrites, edited by Siebentritt, S. and Rau, U. (Springer, Berlin, Heidelberg, New York, 2006), p. 113.Google Scholar
14 Siebentritt, S., Rega, N., Zajogin, A., and Lux-Steiner, M. C.. phys. stat. sol. c, 2004. 1, 2304.Google Scholar
15 Zunger, A., Zhang, S. B., and Wei, S.-H., 26th IEEE PV Specialist Conference, 1997, 313 Google Scholar
16 Wei, S.-H., Zhang, S. B., and Zunger, A.. Appl. Phys. Lett., 1998. 72, 3199.Google Scholar
17 Zhang, S. B., Wei, S.-H., Zunger, A., and Katayama-Yoshida, H.. Phys. Rev. B, 1998. 57, 9642.Google Scholar
18 Bauknecht, A., Blieske, U., Kampschulte, T., Bruns, J., Diesner, K., Tomm, Y., Chichibu, S., and Lux-Steiner, M.-C.. Inst. Phys. Conf. Ser., 1998. 152, 269.Google Scholar
19 Jaffe, J. E. and Zunger, A.. Phys. Rev. B, 1983. 28, 5822.Google Scholar
20 Mandel, L., Tomlinson, R. D., and Hampshire, M. J.. J. Appl. Cryst., 1977. 10, 130.Google Scholar
21 Haupt, H. and Hess, K.. Inst. Phys. Conf. Ser., 1977. 35, 5.Google Scholar
22 Groenink, J. A. and Janse, P. H.. Z. Physikalische Chemie N. F., 1978. 110, 17.Google Scholar