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Organic Semiconductor Thin Films Deposited by Resonant Infrared Matrix-Assisted Pulsed Laser Evaporation: A Fundamental Study of the Emulsion Target

Published online by Cambridge University Press:  30 December 2014

Yuankai Liu ,
Ayomide Atewologun  and
Adrienne D. Stiff-Roberts
Yuankai Liu
Affiliation:
Department of Electrical and Computer Engineering, Duke University, Durham NC 27708, U.S.A. NSF Research Triangle Materials Research Science & Engineering Center, Duke University, Durham, NC 27708, U.S.A.
Ayomide Atewologun
Affiliation:
Department of Electrical and Computer Engineering, Duke University, Durham NC 27708, U.S.A. NSF Research Triangle Materials Research Science & Engineering Center, Duke University, Durham, NC 27708, U.S.A.
Adrienne D. Stiff-Roberts*
Affiliation:
Department of Electrical and Computer Engineering, Duke University, Durham NC 27708, U.S.A. NSF Research Triangle Materials Research Science & Engineering Center, Duke University, Durham, NC 27708, U.S.A.
*
*E-mail: yl271@duke.edu
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Abstract

Poly (3-hexylthiophene) (P3HT) thin films were deposited using emulsion-based, resonant infrared matrix-assisted pulsed laser evaporation (RIR-MAPLE) from emulsions containing different solvents and different alcohols, to investigate the impact of emulsion on film morphology. The atomic force microscopy (AFM) and grazing-incidence, wide angle x-ray scattering (GIWAXS) results show that surface morphology of RIR-MAPLE as-deposited films can be varied from rough to smooth and the microcrystalline domain orientations with respect to the substrate can be tuned from randomly oriented to preferentially oriented in the vertical direction. The demonstrated ability to tune the structural characteristics of polymer thin films by controlling the target emulsion is important for the application of organic optoelectronic devices deposited by RIR-MAPLE.

Keywords

filmorganicpolymer
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1733: Symposium Q – Fundamentals of Organic Semiconductors—Synthesis, Morphology, Devices and Theory , 2014 , mrsf14-1733-q11-19
Copyright
Copyright © Materials Research Society 2014 

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References

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