Skip to main content Accessibility help
×
Home
Hostname: page-component-99c86f546-5rzhg Total loading time: 0.199 Render date: 2021-11-28T03:50:14.575Z Has data issue: true Feature Flags: { "shouldUseShareProductTool": true, "shouldUseHypothesis": true, "isUnsiloEnabled": true, "metricsAbstractViews": false, "figures": true, "newCiteModal": false, "newCitedByModal": true, "newEcommerce": true, "newUsageEvents": true }

Nanoscale Measurements of Electronic Properties in Organic Thin Film Transistors

Published online by Cambridge University Press:  01 February 2011

Oren Tal
Affiliation:
Department of Physical Electronics, Faculty of Engineering, Tel Aviv University, Tel Aviv 69978, Israel.
Yossi Rosenwaks
Affiliation:
Department of Physical Electronics, Faculty of Engineering, Tel Aviv University, Tel Aviv 69978, Israel.
Yohai Roichman
Affiliation:
Department of Electrical Engineering Dept., Technion Israel institute of technology, Haifa 32000, Israel.
Nir Tessler
Affiliation:
Department of Electrical Engineering Dept., Technion Israel institute of technology, Haifa 32000, Israel.
Calvin K. Chan
Affiliation:
Department of Electrical Engineering, Princeton University, Princeton NJ 08544, USA
Antoine Kahn
Affiliation:
Department of Electrical Engineering, Princeton University, Princeton NJ 08544, USA
Get access

Abstract

Kelvin probe force microscopy was used for extraction of the threshold and the pinch off voltages in organic thin film transistors. The first was determined by direct detection of the charge accumulation onset and the latter by a direct observation of the pinch off region formation. In addition, an effective threshold voltage shift can be extracted from the pinch-off voltage as a function of charge concentration. The dependence of the effective threshold voltage on the gate voltage must be considered when calculating charge carrier concentrations in organic thin film transistors.

Type
Research Article
Copyright
Copyright © Materials Research Society 2005

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Arkhipov, V. I., Emelianova, E. V., and Bassler, H., Philos. Mag. B-Phys. Condens. Matter Stat. Mech. Electron. Opt. Magn. Prop. 81 (9), 985996 (2001); Mcjm Vissenberg and M. Matters, Physical Review B 57 (20), 12964-12967 (1998).Google Scholar
2 Arkhipov, V. I., Emelianova, E. V., and Bassler, H., Philos. Mag. B-Phys. Condens. Matter Stat. Mech. Electron. Opt. Magn. Prop. 81 (9), 985 (2001); Mcjm Vissenberg and M. Matters, Physical Review B 57 (20), 12964 (1998).Google Scholar
3 Horowitz, G., Hajlaoui, M.E., and Hajlaoui, R., J. Appl. Phys. 87 (9 Pt1), 4456 (2000); H. Sirringhaus, N. Tessler, and R.H. Friend, Science 280, 1741 (1998); C. Tanase, E. J. Meijer, P. W. M. Blom et al., Physical Review Letters 91 (21), 216601 (2003).CrossRefGoogle Scholar
4 Meijer, E. J., Tanase, C., Blom, P. W. M. et al., Applied Physics Letters 80 (20), 3838 (2002).CrossRefGoogle Scholar
5 Roichman, Y., Preezant, Y., and Tessler, N., Physica Status Solidi a-Applied Research 201 (6), 1246 (2004).CrossRefGoogle Scholar
6 Roichman, Y, Tal, O, Rosenwaks, Y, and Tessler, N, Submitted for publication.Google Scholar
7 Nonnenmacher, M, O'Boyle M, P, Wickramasinghe H, K. “Kelvin probe force microscopyApplied Physics Letters, 58, (25), 2921 (1991).CrossRefGoogle Scholar
8 Lagowski, L, Balestra C, L, and Gatos H, C, “Electronic characteristics of ‘real’ CdS surfacesSurf. Sci. 29, (1), 213 (1972).CrossRefGoogle Scholar
9 Shikler, R., Fried, N., Meoded, T. et al., Physical Review B 61 (16), 11041 (2000).CrossRefGoogle Scholar
10 Tal, O., Gao, W., Chan, C. K., Kahn, A., Rosenwaks, Y., Applied Physics Letters, 85, (18), 4148 (2004).CrossRefGoogle Scholar

Send article to Kindle

To send this article to your Kindle, first ensure no-reply@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about sending to your Kindle. Find out more about sending to your Kindle.

Note you can select to send to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be sent to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Nanoscale Measurements of Electronic Properties in Organic Thin Film Transistors
Available formats
×

Send article to Dropbox

To send this article to your Dropbox account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Dropbox.

Nanoscale Measurements of Electronic Properties in Organic Thin Film Transistors
Available formats
×

Send article to Google Drive

To send this article to your Google Drive account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Google Drive.

Nanoscale Measurements of Electronic Properties in Organic Thin Film Transistors
Available formats
×
×

Reply to: Submit a response

Please enter your response.

Your details

Please enter a valid email address.

Conflicting interests

Do you have any conflicting interests? *