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Monitoring Organic Thin Film Growth In Aqueous Solution In-situ With A Combined Quartz Crystal Microbalance and Ellipsometry

Published online by Cambridge University Press:  01 February 2011

Amitabha Sarkar
Affiliation:
amitabhas75@gmail.com, University of Nebraska, Lincoln, Electrical Engineering, Lincoln, Nebraska, United States
Tapani Viitala
Affiliation:
tviitala@ksvltd.fi, KSV Instruments Ltd., Helsinki, Finland
Tino Hofmann
Affiliation:
thofmann@engr.unl.edu, University of Nebraska, Lincoln, Electrical Engineering, Lincoln, Nebraska, United States
Tom E. Tiwald
Affiliation:
ttiwald@jawoollam.com, J.A.Woollam Co. Inc., Lincoln, Nebraska, United States
John A. Woollam
Affiliation:
jwoollam@jawoollam.com, J.A.Woollam Co. Inc., Lincoln, Nebraska, United States
Ann Kjerstad
Affiliation:
ann.kjerstad@gmail.com, University of Nebraska, Lincoln, Electrical Engineering, Lincoln, Nebraska, United States
Bahar Laderian
Affiliation:
baharladerian@gmail.com, University of Nebraska, Lincoln, Electrical Engineering, Lincoln, Nebraska, United States
Mathias Schubert
Affiliation:
schubert@engr.unl.edu, University of Nebraska, Lincoln, Electrical Engineering, Lincoln, Nebraska, United States
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Abstract

The change of the visible light ellipsometric parameters and mechanical harmonic frequencies of a hydrophobic gold surface attached to a quartz crystal are measured in aqueous solution during deposition of synperonic polymer thin film. The ellipsometry data reveal the amount of polymer mass attached to the surface, while the mechanical resonance shifts are caused by the total mass attached to the surface. Analysis of the combined ellipsometry and quartz crystal microbalance data reveal that the polymer thin film has a high water content, and we determine in-situ, for the first time, the porosity, or the water content, of a polymer thin film in aqueous solution.

Type
Research Article
Copyright
Copyright © Materials Research Society 2009

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