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Meyer-Neldel Rule in Deep-Level-Transient-Spectroscopy and its Ramifications
Published online by Cambridge University Press: 01 February 2011
Abstract
This paper presents data showing a Meyer-Neldel rule (MNR) in InGaAsN alloys. It is shown that without this knowledge, significant errors will be made using Deep-Level Transient-Spectroscopy (DLTS) emission data to determine capture cross sections. By correctly accounting for the MNR in analyzing the DLTS data the correct value of the cross section is obtained.
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- Copyright © Materials Research Society 2003
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