Skip to main content Accessibility help

We use cookies to distinguish you from other users and to provide you with a better experience on our websites. Close this message to accept cookies or find out how to manage your cookie settings.

Close cookie message
×
Home
  • Home
Hostname: page-component-559fc8cf4f-s65px Total loading time: 0.268 Render date: 2021-03-06T15:27:07.627Z Has data issue: true Feature Flags: { "shouldUseShareProductTool": true, "shouldUseHypothesis": true, "isUnsiloEnabled": true, "metricsAbstractViews": false, "figures": false, "newCiteModal": false, "newCitedByModal": true }
EnglishFrançais
MRS Online Proceedings Library (OPL) MRS Online Proceedings Library (OPL)

Article contents

Electrical and structural properties of ABO3/SrTiO3 interfaces

Published online by Cambridge University Press:  18 May 2012

A. Kalabukhov ,
T. Claeson ,
P.P. Aurino ,
R. Gunnarsson ,
D. Winkler ,
E. Olsson ,
N. Tuzla ,
J. Börjesson ,
Yu.A. Boikov ,
I.T. Serenkov ,
V.I. Sakharov  and
M.P. Volkov
A. Kalabukhov
Affiliation:
Dept. Microtechn. and Nanosci. (MC2), Chalmers Univ. Techn., 41296 Gothenburg, Sweden Skobeltsyn Inst. Nuclear Physics, Dept Physics, Moscow State Univ., 119899 Moscow, Russia
T. Claeson
Affiliation:
Dept. Microtechn. and Nanosci. (MC2), Chalmers Univ. Techn., 41296 Gothenburg, Sweden
P.P. Aurino
Affiliation:
Dept. Microtechn. and Nanosci. (MC2), Chalmers Univ. Techn., 41296 Gothenburg, Sweden
R. Gunnarsson
Affiliation:
Dept. Microtechn. and Nanosci. (MC2), Chalmers Univ. Techn., 41296 Gothenburg, Sweden
D. Winkler
Affiliation:
Dept. Microtechn. and Nanosci. (MC2), Chalmers Univ. Techn., 41296 Gothenburg, Sweden
E. Olsson
Affiliation:
Department of Applied Physics, Chalmers Univ. Techn., SE-41296 Gothenburg, Sweden
N. Tuzla
Affiliation:
Department of Applied Physics, Chalmers Univ. Techn., SE-41296 Gothenburg, Sweden
J. Börjesson
Affiliation:
Department of Applied Physics, Chalmers Univ. Techn., SE-41296 Gothenburg, Sweden
Yu.A. Boikov
Affiliation:
Ioffe Physico-Technical Institute Russian Academy of Sciences, 194021 St. Petersburg, Russia
I.T. Serenkov
Affiliation:
Ioffe Physico-Technical Institute Russian Academy of Sciences, 194021 St. Petersburg, Russia
V.I. Sakharov
Affiliation:
Ioffe Physico-Technical Institute Russian Academy of Sciences, 194021 St. Petersburg, Russia
M.P. Volkov
Affiliation:
Ioffe Physico-Technical Institute Russian Academy of Sciences, 194021 St. Petersburg, Russia
Get access

Abstract

Electrical transport and microstructure of interfaces between nm-thick films of various perovskite oxides grown by pulsed laser deposition (PLD) on TiO2- terminated SrTiO3 (STO) substrates are compared. LaAlO3/STO and KTaO3/STO interfaces become quasi-2DEG after a critical film thickness of 4 unit cell layers. The conductivity survives long anneals in oxygen atmosphere. LaMnO3/STO interfaces remain insulating for all film thicknesses and NdGaO3/STO interfaces are conducting but the conductivity is eliminated after oxygen annealing. Medium-energy ion spectroscopy and scanning transmission electron microscopy detect cationic intermixing within several atomic layers from the interface in all studied interfaces. Our results indicate that the electrical reconstruction in the polar oxide interfaces is a complex combination of different mechanisms, and oxygen vacancies play an important role.

Keywords

laser ablation thin film microstructure
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1454: Symposium HH – Nanocomposites, Nanostructures and Heterostructures of Correlated Oxide Systems , 2012 , pp. 167 - 172
Copyright
Copyright © Materials Research Society 2012

Access options

Get access to the full version of this content by using one of the access options below.
If you should have access and can't see this content please contact technical support.

References

Ohtomo, A. and Hwang, H.Y., Nature (London), 427, 423 (2004).Google Scholar
Thiel, S., Hammerl, G., Schmehl, A., Schneider, C.W., and Mannhart, J., Science 313, 1942 (2006).CrossRef
Brinkman, A., Huijben, M., Vanzeln, M., Huijben, J., Zeitler, U., Man, J.C., Van Der Wiel, W.G., Rijnders, G., Blank, D.H.A., and Hilgenkamp, H.H., Nature Mater. 6, 493 (2007).CrossRef
Kalabukhov, A., Boikov, Yu. A., Serenkov, I. T., Sakharov, V. I., Börjesson, J., Ljustina, N., Olsson, E., Winkler, D., and Claeson, T., EPL 93, 37001 (2011).CrossRef
Cancellieri, C., Reyren, N., Gariglio, S., Caviglia, A. D., Fete, A., and Triscone, J.-M., EPL 91, 17004 (2010)CrossRef
Siemons, W., Koster, G., Yamamoto, H., Harrison, W. A., Lukovsky, G., Geballe, T. H., Blank, D. H. A. and Beasley, M. R., Phys.Rev.Lett. 98, 196802 (2007)CrossRef
Takizawa, M., Tsuda, S., Susaki, T., Hwang, H. Y., and Fujimori, A., Phys.Rev. B 84, 245124 (2011)CrossRef
Nakagawa, N., Hwang, H.Y., and Muller, D.A., Nature Mater. 5, 204, 2006.CrossRef
Huijben, M., Brinkman, A., Koster, G., Rijnders, G., Hilgenkamp, H., and Blank, D. H. A., Adv. Mater. 21, 1 (2009)
Willmott, P.R., Pauli, S.A., Herger, R., Schleputz, C.M., Kumah, D., Cionca, C., and Yacoby, Y., Phys.Rev.Lett. 99, 155502 (2007)CrossRef
Kalabukhov, A.S., Boikov, Yu.A., Serenkov, I.T., Sakharov, V.I., Popok, V.N., Gunnarsson, R., Börjesson, J., Ljustina, N., Olsson, E., Winkler, D., and Claeson, T., Phys.Rev.Lett. 103,146101 (2009).CrossRef
Chambers, S.A., Engelhard, M.H., Shutthanandan, V., Zhu, Z., Droubay, T.C., Qiao, L., Sushko, P.V., Feng, T., Lee, H.D., Gustafsson, T., Garfunkel, E., Shah, A.B., Zuo, J.-M., and Ramasse, Q.M., Surface Science Reports 65, 317 (2010)CrossRef
Perna, P., Maccariello, D., Radovic, M., Scotti di Uccio, U., Pallecchi, I., Codda, M., Marré, D., Cantoni, C., Gazquez, J., Varela, M., Pennycook, S. J., and Miletto Granozio, F., Appl. Phys. Lett. 97, 152111 (2010)CrossRef
Choi, W. S., Jeong, D. W., Jang, S. Y., Marton, Z., Seo, S. S. A., Lee, H. N., and Lee, Y. S., J. of the Korean Physical Society 58, 569 (2011)CrossRef
Luysberg, M., Heidelmann, M., Houben, L., Boese, M., Heeg, T., Schubert, J., and Roeckerath, M., Acta Materialia 57, 3192 (2009)
Chambers, S.A., Surf.Sci. 605, 1133 (2011)CrossRef
Bert, J. A., Kalisky, B., Bell, C., Kim, M., Hikita, Y., Hwang, H.Y., and Moler, K. A., Nature Phys. 7, 767 (2011)CrossRef
Cui, Y., Salvador, J. R., Yang, J., Wang, H., Amow, G., and Kleinke, H., J. Electronic Materials 38, 1002 (2009)CrossRef
Chen, Y., Pryds, N., Kleibeuker, J. E., Koster, G., Sun, J., Stamate, E., Shen, B., Rijnders, G., and Linderoth, S., Nano Lett. 11, 3774 (2011)CrossRef

Full text views

Full text views reflects PDF downloads, PDFs sent to Google Drive, Dropbox and Kindle and HTML full text views.

Total number of HTML views: 0
Total number of PDF views: 17 *
View data table for this chart

* Views captured on Cambridge Core between September 2016 - 6th March 2021. This data will be updated every 24 hours.

Send article to Kindle

To send this article to your Kindle, first ensure no-reply@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about sending to your Kindle. Find out more about sending to your Kindle.

Note you can select to send to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be sent to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Electrical and structural properties of ABO3/SrTiO3 interfaces
Available formats
×

Send article to Dropbox

To send this article to your Dropbox account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Dropbox.

Electrical and structural properties of ABO3/SrTiO3 interfaces
Available formats
×

Send article to Google Drive

To send this article to your Google Drive account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Google Drive.

Electrical and structural properties of ABO3/SrTiO3 interfaces
Available formats
×
×

Reply to: Submit a response

Your details

Conflicting interests

Do you have any conflicting interests? *