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Published online by Cambridge University Press: 10 February 2011
The growth of thin films has been categorized into three types namely the Frank-van der Merwe (FM) mode, the Stranski-Krastanov (SK) mode, and the Volmer-Weber (VW) mode. The strain, surface, and interfacial energies were calculated for the three types of growth mode of the GaInN/GaN and GaPSb/GaP systems by considering the effects of the dislocation density and reconstruction of dangling bonds. The phase diagrams of the growth modes were determined for the GaInN/GaN and GaPSb/GaP systems. In the GaInN/GaN system, the VW mode appears in the most region of the phase diagram. The region of the VW mode becomes smaller as the dislocation density increases. In the GaPSb/GaP system, the SK and VW modes appear and the region of these modes becomes larger as the reconstruction ratio increases
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