Hostname: page-component-78c5997874-94fs2 Total loading time: 0 Render date: 2024-11-18T22:05:33.522Z Has data issue: false hasContentIssue false
  • English
  • Français

Effects of Atmospheric Pressure Dielectric Barrier Discharge Plasma Irradiation on Yeast Growth

Published online by Cambridge University Press:  21 May 2012

Satoshi Kitazaki ,
Kazunori Koga ,
Masaharu Shiratani  and
Nobuya Hayashi
Satoshi Kitazaki
Affiliation:
Graduate School of Information Science and Electrical Engineering, Kyushu University, 744 Motooka, Nishi-ku, Fukuoka, 819-0395, Japan
Kazunori Koga
Affiliation:
Graduate School of Information Science and Electrical Engineering, Kyushu University, 744 Motooka, Nishi-ku, Fukuoka, 819-0395, Japan
Masaharu Shiratani
Affiliation:
Graduate School of Information Science and Electrical Engineering, Kyushu University, 744 Motooka, Nishi-ku, Fukuoka, 819-0395, Japan
Nobuya Hayashi
Affiliation:
Interdisciplinary Graduate School of Engineering Sciences, Kyushu University, 6-1 Kasuga-koen, Kasuga-shi, Fukuoka 816-8580, Japan
Get access

Abstract

We investigated effects of atmospheric pressure dielectric barrier discharge (DBD) plasma irradiation on growth characteristics of bread yeast (Saccharomyces cerevisie). Nitric oxide of 400 ppm and O3 above 200 ppm are produce by the DBD plasmas. DBD plasma irradiation of 50 and 100 s enhances the growth of yeast in the lag phase, whereas 150 s irradiation suppresses the growth. There is an optimum duration of plasma irradiation for the growth promotion.

Keywords

biomedicalchemical reactionradiation effects
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1469: Symposium WW – Plasma Processing and Diagnostics for Life Sciences , 2012 , mrss12-1469-ww06-08
Copyright
Copyright © Materials Research Society 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Hayashi, N., Guan, W., Tsutsui, S., Tomari, T., and Hanada, Y., Jpn. J. Appl. Phys. 45, 8358 (2006).Google Scholar
2. Hayashi, N. and Yagyu, Y., Trans. Mater. Res. Soc. Jpn. 33, 791 (2008).Google Scholar
3. Helmke, D. Hoffmeister, N. Mertens, S. Emmert, J. Schuette, , and Vioel, W.: New J. Phys. 11, 115025 (2009).10.1088/1367-2630/11/11/115025Google Scholar
4. Pomp, R., Jamitzky, F., Shimizu, T., Steffes, B., Bunk, W., Schmidt, H. U., Georgi, M., Ramrath, K., Stolz, W., Stark, R. W., Urayama, T., Fujii, S., and Morfill, G. E.: New J. Phys. 11, 115020 (2009).Google Scholar
5. Lee, J., Shon, C. H., Kim, Y. S., Kim, S., Kim, G. C., and Kong, M. G., New J. Phys. 11, 115026 (2009).Google Scholar
6. Bayliss, D. L., Walsh, J. L., Shama, G., Iza, F., and Kong, M. G., New J. Phys. 11, 115024 (2009).Google Scholar
7. Dubinov, A. E., Lazarenko, E. R., and Selemir, V. D., IEEE Trans. Plasma Sci. 28, 180 (2000).10.1109/27.842898Google Scholar
8. Kalghatgi, S. U., Fridman, A, Friedman, G, and Clyne, A.M, Proc. IEEE Eng. Med. Biol. Soc. 6030 (2009).Google Scholar
9. Kalghatgi, S., Kelly, C. M., Cerchar, E., Torabi, B., Alekseev, O., Fridman, A., Friedman, G., and Azizkhan-Clifford, J., PLoS ONE, 6(1), e16270 (2011).Google Scholar
10. Vega-Mercado, H., Martin-Belloso, O., Qin, B. L., Chang, F. J., Marcela Góngora-Nieto, M., Barbosa-Canovas, G. V., and Swanson, B. G., Trends in food science & technology, 8(5), 151–157. (1997).Google Scholar
11. Sera, B., Spatenka, P., Sery, M., Vrchotova, N., and Hruskova, I., IEEE Trans. Plasma Sci. 38, 2963 (2010).10.1109/TPS.2010.2060728Google Scholar
12. Sera, B., Stranak, V., Sery, M., Tichy, M., and Spatenka, P., Plasma Sci. Technol. 10, 506 (2008).Google Scholar
13. Dobrynin, D., Fridman, G., Friedman, G., and Fridman, A., New J. Phys. 11, 115020 (2009).10.1088/1367-2630/11/11/115020Google Scholar
14. Ebrahim, M. K. H., Acta Agron. Hungarica 52, 113 (2004).Google Scholar
15. Volin, J. C., Denes, F. S., Young, R. A., and Park, S. M. T., Crop Sci. 40, 1706. (2000)Google Scholar
16. Takaki, K. and Ihara, S.: Denki Gakkai Ronbunshi A 129, 439 (2009) [in Japanese].Google Scholar
17. Kitazaki, S., Yamashita, D., Matsuzaki, H., Uchida, G., Koga, K., and Shiratani, M., Proc. IEEE TENCON. p.1960 (2010).Google Scholar
18. Akiyoshi, Y., Nakahigashi, A., Hayashi, N., Kitazaki, S., Iwao, T., Koga, K., and Shiratani, M., Proc. IEEE TENCON, p.1957 (2010).Google Scholar
19. Hayashi, N., Nakahigashi, A., Goto, M., Kitazaki, S., Koga, K., and Shiratani, M., Jpn. J. Appl. Phys. 50, 08JF04 (2011).10.7567/JJAP.50.08JF04Google Scholar
20. Kitazaki, S., Koga, K., Shiratani, M., and Hayashi, N., Jpn. J. Appl. Phys. 51, 01AE01 (2012).10.7567/JJAP.51.01AE01Google Scholar