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Dynamic TEM Observation on Oxide Glass Materials
Published online by Cambridge University Press: 21 February 2011
Abstract
Intensity fluctuation in high resolution electron microscope (HREM) images of amorphous Tl-Ba-Ca-Cu-O oxide films is observed. The fluctuation with a frequency of few tens of Hertz and an amplitude of about 0.3nm, occurs under an intense electron beam irradiation. It is shown experimentally that atom migration in the films is responsible for the fluctuations. The result is also supported by computer image simulations on a model structure for amorphous film.
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- Copyright © Materials Research Society 1990
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