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Dynamic Properties of Spectrally Selective Reactively Sputtered Metal Oxides

Published online by Cambridge University Press:  10 May 2013

A.V. Adedeji ,
S.D. Worsley ,
T.L. Baker ,
R. Mundle ,
A.K. Pradhan ,
A.C. Ahyi  and
T. Isaacs-Smith
A.V. Adedeji*
Affiliation:
Department of Chemistry, Geology & Physics, Elizabeth City State University, 1704 Weeksville Road, Elizabeth City, NC 27909, USA
S.D. Worsley
Affiliation:
Department of Chemistry, Geology & Physics, Elizabeth City State University, 1704 Weeksville Road, Elizabeth City, NC 27909, USA
T.L. Baker
Affiliation:
Department of Chemistry, Geology & Physics, Elizabeth City State University, 1704 Weeksville Road, Elizabeth City, NC 27909, USA
R. Mundle
Affiliation:
Center for Materials Research, Norfolk State University, 700 Park Avenue, Norfolk, VA 23504, USA
A.K. Pradhan
Affiliation:
Center for Materials Research, Norfolk State University, 700 Park Avenue, Norfolk, VA 23504, USA
A.C. Ahyi
Affiliation:
Department of Physics, Auburn University, Auburn, AL 36849, USA
T. Isaacs-Smith
Affiliation:
Department of Physics, Auburn University, Auburn, AL 36849, USA
*
*Email: avadedeji@mail.ecsu.edu
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Abstract

Thin films of Transition Metal Oxides (TMOs) were deposited by reactive sputtering of pure transition metal targets in Argon-Oxygen gas mixture at elevated substrate temperature for efficient energy consumption. The atomic composition and thickness of the TMO films was determined by Rutherford Backscattering Spectroscopy (RBS). Optical transmittance and reflectance spectrum of the films on quartz substrate was measured with thin film measuring system at room temperature and slightly elevated temperature. The surface morphology and structure of the TMO films was determined with Atomic Force Microscope (AFM).

Keywords

sputteringoptical propertiesRutherford backscattering (RBS)
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1494: Symposium F – Oxide Semiconductors and Thin Films , 2013 , pp. 245 - 251
Copyright
Copyright © Materials Research Society 2013 

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References

REFERENCES

Kanu, S.S., Binions, R., Thin Films for Solar Control Applications, Proc. R. Soc. A 466 (2010) 19–44 CrossRefGoogle Scholar
Cao, Jinbo and Wu, Junqiao, Strain effect in low-dimensional transition metal oxides, Materials Science and Engineering R 71 (2011) 35–52 CrossRefGoogle Scholar
Musfeldt, J.L., Functional Metal Oxide Nanostructures, Springer Series in Materials Science 149, DOI 10.1007/978-1-4419-9931-3_5, Wu, J. et al. (eds.): Chapter 5-Optical Properties of Nanoscale Transition Metal Oxides.Google Scholar
Oensstein, J. and Millis, A.J., Advances in the Physics of high-temperature superconductivity, Science 288 (2000) 468–474 CrossRefGoogle Scholar
Basov, D.N. and Timusk, T., Electrodynamics of high-Tc superconductors, Rev. Mod. Phys. 77 (2005) 721.CrossRefGoogle Scholar
Granqvist, C.G., Green, S., Niklasson, G.A., Mlyuka, N.R., von Kraemer, S. and Georen, P., Advances in Chromogenic materials and devices, Thin Solid Films 518 (2010) 3046–3053.CrossRefGoogle Scholar
Lampert, C.M., Smart switchable glazing for solar energy and day light control, Solar Energy Mater., Solar Cells 52 (1998) 207.CrossRefGoogle Scholar
Granqvist, C.G., Solar energy materials, Adv. Mater. 15 (2003) 1789–1803.CrossRefGoogle Scholar
Granqvist, C.G., Radiative heating and cooling with spectrally selective surfaces, Appl. Opt. 20 (1981) 2606 CrossRefGoogle ScholarPubMed
Manning, T.D., Parkin, I.P., Clark, R.J.H., Sheel, D., Pemble, M.E. and Vernadou, D., Intelligent window coatings: atmospheric pressure chemical vapour deposition of vanadium oxides, J. Mater. Chem. 12 (2002) 2936–2939 CrossRefGoogle Scholar
Lampert, C.M., Optical switching technology for glazings, Thin Solid Films 236 (1993) 6 CrossRefGoogle Scholar
Bouessay, I., Rougier, A., Poizot, P., Moscovici, J., Michalowicz, A. and Tarascon, J.M., Electrochromic degradation in nickel oxide thin films: a self-discharge and dissolution phenomenon, Electrochim. Acta 50 (2005) 3737 CrossRefGoogle Scholar