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Depression of the Glass Transition Temperature in Ultra-Thin, Grafted Polystyrene Films
Published online by Cambridge University Press: 15 February 2011
Abstract
We have used ellipsometry to measure the glass transition temperature (Tg) of ultrathin films of polystyrene (PS) (less than 10 nm thick) obtained by grafting PS-COOH on the native oxide of Si. We find that Tg in these ultra-thin films is depressed from the bulk value by as much as, 35 K. This is in qualitative accord with our earlier results on thicker non-grafted films of PS.
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- Copyright © Materials Research Society 1995
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