Published online by Cambridge University Press: 10 February 2011
Random fluctuations of localized state energies will result in thermal release of carriers trapped in those states at shorter times than would be observed from a stationary distribution of the same energies. An experimentally observed distribution of activation energies will hence differ from the distribution of average energies of the states involved. It will also be temperature-dependent. In a-Si:H, low-frequency fluctuations with a spectrum comparable to the one of 1/f noise, can account for the measured temperature dependence of the distribution. They also explain the apparent shift in localized-state energy under steady-state illumination.
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