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A Defect Map for Degradation of Ingaasp/Inp Long Wavelength Laser Diodes
Published online by Cambridge University Press: 10 February 2011
Abstract
We summarize the characteristic defect structures associated with gradual-degradation, rapiddegradation, catastrophic (mirror-facet) optical damage (COD), electric static discharge (ESD) and electric overstress (EOS) damages to provide a defect-map for device failure mode analysis. The generation mechanisms of these lattice defects are discussed which pinpoint the weak links in the device structures.
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- Copyright © Materials Research Society 1996
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