Skip to main content Accessibility help
×
Home
Hostname: page-component-77ffc5d9c7-5dsxc Total loading time: 0.419 Render date: 2021-04-23T11:36:36.394Z Has data issue: true Feature Flags: { "shouldUseShareProductTool": true, "shouldUseHypothesis": true, "isUnsiloEnabled": true, "metricsAbstractViews": false, "figures": false, "newCiteModal": false, "newCitedByModal": true }

CW and Time-Resolved Photoluminescence Analysis of Silicon Implanted Glass Low-Temperature Annealed at Different Times

Published online by Cambridge University Press:  10 February 2011

Gong-Ru Lin
Affiliation:
Institute of Electro-Optical Engineering, National Chiao Tung University, 1001, Ta Hsueh Rd., Hsinchu, Taiwan 300, R.O.C.
Chun-Jung Lin
Affiliation:
Institute of Electro-Optical Engineering, National Chiao Tung University, 1001, Ta Hsueh Rd., Hsinchu, Taiwan 300, R.O.C.
Get access

Abstract

The effects of annealing time on continuous-wave (CW) and nanosecond time-resolved (TR) photoluminescence (PL) spectra of silicon-ion-implanted Borosilicate glass (BSO:Si+) annealing at 500°C are characterized. A broadband CWPL of the as-implanted BSO:Si+ at 450-530 nm is observed, and the luminescent peak is found to slightly red-shift after annealing for 90 min. The increasing CWPL intensity reveals that the natural oxygen vacancy (NOV, ΞSi Si-SiΞ) related irradiative defect is highly activated during 30-min annealing, however, which abruptly decreases with the annealing lengthens to 60-min or longer. The TRPL analysis indicates a non-radiative recombination process with a sub-picosecond lifetime for the blank BSO and the as-implanted BSO:Si+ samples, which gradually disappears as the BSO:Si+ is long-term annealed. The irradiative luminescent lifetime of the 60-min annealed BSO:Si+ is lengthened from 1.7 ns to 2.8 ns, which reveals that the density of the NOV defect is decreasing by at least one order of magnitude. A longer irradiative decay with nearly identical lifetime is also found in all annealed BSO:Si+. The ratios of TRPL peak intensities for different samples correlate well with those observed in CWPL measurement, however, the weighting factors of TRPL intensities for the latter two decaying components are vicissitudinous each other in different samples BSO:Si+. This interprets a significant evolution among different decaying mechanisms during the annealing process.

Type
Research Article
Copyright
Copyright © Materials Research Society 2003

Access options

Get access to the full version of this content by using one of the access options below.

References

1. Klimov, V. I., Schwarz, Ch. J., McBranch, D. W., and White, C. W., Appl. Phys. Lett., 73, pp. 2603 (1998).CrossRefGoogle Scholar
2. Mimura, A.,Fujii, M., Hayashi, S., and Yamamoto, K., J. Lumin., 87-89 429 (2000).CrossRefGoogle Scholar
3. Liao, L. S., Bao, X. M., Zheng, X. Q., Li, N. S., and Min, N. B., Appl. Phys. Lett., 68, 850 (1996).CrossRefGoogle Scholar
4. Amans, D., Guillois, O., Ledoux, G., Porterat, D., and Reynaud, C., J. Appl. Phys., 91, 5334 (2002).CrossRefGoogle Scholar
5. Liao, L. S., Bao, X. M., Li, N. S., Zheng, X. Q., and Min, N. B., J. Lumin., 68 199 (1996).CrossRefGoogle Scholar
6. Song, H. Z., Bao, X.M., Li, N. S., and Zhang, J.Y., J.Appl. Phys., 82 4028 (1997).CrossRefGoogle Scholar
7. Song, H. Z. and Bao, X. M., Phys. Rev. B, 55 6988 (1997).CrossRefGoogle Scholar
8. Shimizu-Iwayma, T., Nakao, S., and Saitoh, K., J. Appl. Phys., 65 1814 (1994).Google Scholar

Full text views

Full text views reflects PDF downloads, PDFs sent to Google Drive, Dropbox and Kindle and HTML full text views.

Total number of HTML views: 0
Total number of PDF views: 8 *
View data table for this chart

* Views captured on Cambridge Core between September 2016 - 23rd April 2021. This data will be updated every 24 hours.

Send article to Kindle

To send this article to your Kindle, first ensure no-reply@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about sending to your Kindle. Find out more about sending to your Kindle.

Note you can select to send to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be sent to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

CW and Time-Resolved Photoluminescence Analysis of Silicon Implanted Glass Low-Temperature Annealed at Different Times
Available formats
×

Send article to Dropbox

To send this article to your Dropbox account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Dropbox.

CW and Time-Resolved Photoluminescence Analysis of Silicon Implanted Glass Low-Temperature Annealed at Different Times
Available formats
×

Send article to Google Drive

To send this article to your Google Drive account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Google Drive.

CW and Time-Resolved Photoluminescence Analysis of Silicon Implanted Glass Low-Temperature Annealed at Different Times
Available formats
×
×

Reply to: Submit a response


Your details


Conflicting interests

Do you have any conflicting interests? *