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Crystalline Alignment and In-plane Texture Improvement of Buffer Layers Deposited on NiW Tapes

Published online by Cambridge University Press:  10 March 2011

Linfei Liu
Affiliation:
Department of Physics, Shanghai Jiao Tong University, Shanghai, Shanghai, China
Yijie Li
Affiliation:
Department of Physics, Shanghai Jiao Tong University, Shanghai, Shanghai, China
Huaran Liu
Affiliation:
Department of Physics, Shanghai Jiao Tong University, Shanghai, Shanghai, China
Xiaokun Song
Affiliation:
Department of Physics, Shanghai Jiao Tong University, Shanghai, Shanghai, China
Dan Hong
Affiliation:
Department of Physics, Shanghai Jiao Tong University, Shanghai, Shanghai, China
Ying Wang
Affiliation:
Department of Physics, Shanghai Jiao Tong University, Shanghai, Shanghai, China
Da Xu
Affiliation:
Department of Physics, Shanghai Jiao Tong University, Shanghai, Shanghai, China
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Abstract

In order to deposit YBCO coated conductor with high critical current densities on rolling assisted biaxially textured Ni-W tapes, this paper has systematically studied the influence of deposition conditions on the orientation, in-plane texture and surface morphology of buffers and superconducting layers. It was found that the crystalline alignment and the in-plane texture of cerium oxide cap-layers were well improved by optimizing deposition parameters. The full width at half maximum of phi-scan x-ray diffraction peaks were reduced from original values of 7-8 degrees to 5-6 degrees. A high critical current density of 4.6×106 A/cm2 has been achieved on optimized buffer layers. This value is comparable with the critical current density of YBCO thin films deposited on single crystalline substrates.

Type
Research Article
Copyright
Copyright © Materials Research Society 2011

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References

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