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CoPt3 nanoparticles adsorbed on SiO2: a GISAXS and SEM study

Published online by Cambridge University Press:  01 February 2011

Jan I. Flege
Affiliation:
Institute of Solid State Physics, University of Bremen, Otto-Hahn-Allee, 28359 Bremen, Germany
Thomas Schmidt
Affiliation:
Institute of Solid State Physics, University of Bremen, Otto-Hahn-Allee, 28359 Bremen, Germany
Gabriela Alexe
Affiliation:
Institute of Solid State Physics, University of Bremen, Otto-Hahn-Allee, 28359 Bremen, Germany
Torben Clausen
Affiliation:
Institute of Solid State Physics, University of Bremen, Otto-Hahn-Allee, 28359 Bremen, Germany
Sigrid Bernstorff
Affiliation:
Sincrotrone Trieste, Strada Statale 14, km 163.5, 34012 Basovizza / Trieste, Italy
Igor Randjelovic
Affiliation:
Institute of Physical Chemistry, University of Hamburg, Grindelallee 117, 20146 Hamburg, Germany
Vesna Aleksandrovic
Affiliation:
Institute of Physical Chemistry, University of Hamburg, Grindelallee 117, 20146 Hamburg, Germany
Andreas Kornowski
Affiliation:
Institute of Physical Chemistry, University of Hamburg, Grindelallee 117, 20146 Hamburg, Germany
Horst Weller
Affiliation:
Institute of Physical Chemistry, University of Hamburg, Grindelallee 117, 20146 Hamburg, Germany
Jens Falta
Affiliation:
Institute of Solid State Physics, University of Bremen, Otto-Hahn-Allee, 28359 Bremen, Germany
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Abstract

Ultra-thin CoPt3 nanoparticle films have been prepared on SiO2 surfaces using a Langmuir-Blodgett (LB) deposition technique. The structural properties of the overlayers have been investigated by grazing-incidence small-angle x-ray scattering (GISAXS) and high-resolution scanning electron microscopy (SEM) for the first time. Self-assembly of the nanoparticles is found and with GISAXS an average particle-particle distance of (8.23 ± 0.06) nm is determined, in good agreement with the SEM results. A particle correlation length of (22.3 ± 1.2) nm was derived which is shown to be independent of the surface coverage. The latter quantity may be controlled by choice of a suitable retraction speed during the LB step.

Type
Research Article
Copyright
Copyright © Materials Research Society 2005

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