Skip to main content Accessibility help
×
Home
Hostname: page-component-78dcdb465f-6zfdk Total loading time: 0.288 Render date: 2021-04-17T12:59:44.808Z Has data issue: true Feature Flags: { "shouldUseShareProductTool": true, "shouldUseHypothesis": true, "isUnsiloEnabled": true, "metricsAbstractViews": false, "figures": false, "newCiteModal": false, "newCitedByModal": true }

Controlling Environment and Contact Materials to Optimize Ohmic Microrelay Lifetimes

Published online by Cambridge University Press:  10 February 2014

Vitali Brand
Affiliation:
Mechanical Engineering, Carnegie Mellon University, Pittsburgh, PA 15213 USA.
Michael S Baker
Affiliation:
Sandia National Labs, Albuquerque, NM 87185 USA.
Maarten P de Boer
Affiliation:
Mechanical Engineering, Carnegie Mellon University, Pittsburgh, PA 15213 USA.
Get access

Abstract

There has been a recent resurgence in interest in developing ohmic switches to complement transistors in order to address challenges associated with electrical current leakage. A critical limitation in ohmic switches remains the reliability of their electrical contacts. These contacts are prone to hydrocarbon induced contamination which progressively inhibits signal transmission, eventually leading to device failure. We report on progress made towards controlling the contamination phenomenon. We discuss how contact materials and operating environment affect device performance, showing that RuO2 coated microswitch contacts operating in the presence of O2 experience very limited contaminant accumulation even in hydrocarbon-rich environments. We then demonstrate that devices which have experienced contamination can recover their original performance by being operated in clean N2:O2 environment. Finally, we suggest that this resistance recovery is associated with the chemical transformation of the contaminant as opposed to its removal and that the transformed contaminant may shield the Pt coating from oxidation.

Type
Articles
Copyright
Copyright © Materials Research Society 2014 

Access options

Get access to the full version of this content by using one of the access options below.

References

Liu, T. J. K., Markovic, D., Stojanovic, V. and Alon, E., Ieee Spectrum 49(4), 3843 (2012).CrossRef
Rebeiz, G. M. and Muldavin, J. B., in Microwave Magazine (IEEE, 2001), Vol. 2, pp. 5971.Google Scholar
Hacker, J. B., Mihailovich, R. E., Kim, M. and DeNatale, J. F., Ieee T Microw Theory 51(1), 305308 (2003).CrossRef
Spencer, M., Chen, F., Wang, C. C., Nathanael, R., Fariborzi, H., Gupta, A., Kam, H., Pott, V., Jeon, J., Liu, T. J. K., Markovic, D., Alon, E. and Stojanovic, V., Ieee J Solid-St Circ 46(1), 308320 (2011).CrossRef
Loh, O. Y. and Espinosa, H. D., Nature Nanotechnology 7(5), 283295 (2012).CrossRef
Sinha, N., Jones, T. S., Guo, Z. J. and Piazza, G., J Microelectromech S 21(2), 484496 (2012).CrossRef
Yang, Z. Y., Lichtenwalner, D. J., Morris, A. S., Krim, J. and Kingon, A. I., J Microelectromech S 18(2), 287295 (2009).CrossRef
Yang, Z., Lichtenwalner, D., Morris, A., Krim, J. and Kingon, A. I., J Micromech Microeng 20(10) (2010).
Majumder, S., Lampen, J., Morrison, R. and Maciel, J., Ieee Instru Meas Mag 6(1), 1215 (2003).CrossRef
Brand, V., Baker, M. S. and de Boer, M. P., Tribol Lett 51(3), 341356 (2013).CrossRef
de Boer, M. P., Czaplewski, D. A., Baker, M. S., Wolfley, S. L. and Ohlhausen, J. A., J Micromech Microeng 22(10) (2012).CrossRef
Brand, V., Baker, M. and Boer, M. de, J Microelectromech S (2013).

Full text views

Full text views reflects PDF downloads, PDFs sent to Google Drive, Dropbox and Kindle and HTML full text views.

Total number of HTML views: 0
Total number of PDF views: 11 *
View data table for this chart

* Views captured on Cambridge Core between September 2016 - 17th April 2021. This data will be updated every 24 hours.

Send article to Kindle

To send this article to your Kindle, first ensure no-reply@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about sending to your Kindle. Find out more about sending to your Kindle.

Note you can select to send to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be sent to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Controlling Environment and Contact Materials to Optimize Ohmic Microrelay Lifetimes
Available formats
×

Send article to Dropbox

To send this article to your Dropbox account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Dropbox.

Controlling Environment and Contact Materials to Optimize Ohmic Microrelay Lifetimes
Available formats
×

Send article to Google Drive

To send this article to your Google Drive account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Google Drive.

Controlling Environment and Contact Materials to Optimize Ohmic Microrelay Lifetimes
Available formats
×
×

Reply to: Submit a response


Your details


Conflicting interests

Do you have any conflicting interests? *