Skip to main content Accessibility help
×
Home

Anisotropic Fracture Behavior of Electroless deposited Ni-P Amorphous Alloy Thin Films

Published online by Cambridge University Press:  17 March 2011

Kazuki Takashima
Affiliation:
Precision and Intelligence Laboratory, Tokyo Institute of Technology, 4259, Nagatsuta, Midori-ku, Yokohama, 226-8503, JAPAN
Akio Ogura
Affiliation:
Precision and Intelligence Laboratory, Tokyo Institute of Technology, 4259, Nagatsuta, Midori-ku, Yokohama, 226-8503, JAPAN
Yusuke Ichikawa
Affiliation:
Precision and Intelligence Laboratory, Tokyo Institute of Technology, 4259, Nagatsuta, Midori-ku, Yokohama, 226-8503, JAPAN
Yakichi Higo
Affiliation:
Precision and Intelligence Laboratory, Tokyo Institute of Technology, 4259, Nagatsuta, Midori-ku, Yokohama, 226-8503, JAPAN
Get access

Abstract

Fracture tests have been carried out for an electroless deposited Ni-P amorphous alloy thin film with different crack growth directions. Cantilever beam type specimens with dimensions of 10 × 10 × 50 μm3 were prepared from a Ni-P amorphous thin film and notches with different directions, which are perpendicular and parallel to the deposition growth direction, were introduced by focused ion beam machining. Fatigue pre-cracks were introduced ahead of the notches. Fracture tests were performed using a mechanical testing machine for micro-sized specimens. Fracture behavior is different between the two types of specimens. As K IC values were not obtained because the criteria of plane strain were not satisfied for this size of the specimen, the provisional fracture toughness K Q values were determined. The K Q value of the specimen with crack propagation direction being perpendicular to the deposition growth direction was 4.2 MPam1/2, while that with crack propagation direction being parallel to the deposition growth direction was 7.3 MPam1/2. This result suggests that the electroless deposited Ni-P amorphous alloy thin film has anisotropic fracture properties.

Type
Research Article
Copyright
Copyright © Materials Research Society 2001

Access options

Get access to the full version of this content by using one of the access options below.

References

1. Li, X. and Bhushan, B., Thin Solid Films, 315, 214 (1998).CrossRefGoogle Scholar
2. Ballarini, R., Mullen, R. L., Yin, Y., Kahn, H., Stemmer, S. and Heuer, A. H., J. Mater. Res., 12, 915 (1997).CrossRefGoogle Scholar
3. Lewis, D. B. and Marshall, G. W., Surface and Coating Tech., 78, 150 (1996).CrossRefGoogle Scholar
4. chikawa, Y., Maekawa, S., Takashima, K., Shimojo, M., Higo, Y. and Swain, M. V., in Materials Science of Microelectromechanical Systems (MEMS) Devices II, ed. by deBoer, M. P., Heuer, A. H., Jacobs, S. J. and Peeters, E., (Mat. Res. Soc. Proc., 605, Pittsburgh, PA, 2000) pp. 273278.Google Scholar
5. Takashima, K., Shimojo, M., Higo, Y. and Swain, M. V., in Proc. Microscale Systems: Mechanics and Measurements Symposium., (Soc. for Experimental Mechanics, Inc., 2000) pp. 3235.Google Scholar
6. Takashima, K., Kimura, T., Shimojo, M., Higo, Y., Sugiura, S. and Swain, M. V., in Fatigue '99 (Proc. 7th Fatigue Cong.), ed. by Wu, X-R. and Wang, Z-G., (Higher Education Press, Beijing, 1999) pp. 18711876.Google Scholar
7. Higo, Y., Takashima, K., Shimojo, M., Sugiura, S., Pfister, B. and Swain, M. V., in Materials Science of Microelectromechanical Systems (MEMS) Devices II, ed. by deBoer, M. P., Heuer, A. H., Jacobs, S. J. and Peeters, E., (Mat. Res. Soc. Proc., 605, Pittsburgh, PA, 2000) pp. 241246.Google Scholar
8. Okamura, H., in Introduction to Linear Fracture Mechanics, (Baifukan, Tokyo, 1976), p. 218 (in Japanese).Google Scholar
9. Knott, J. F., in Fundamentals of Fracture a Mechanics, (Butterworths, London, 1976), p. 124.Google Scholar
10. Gilmann, J. J., J. Appl. Phys., 46, 1625 (1975).CrossRefGoogle Scholar
11. Lanchava, B., Hoffmann, H., Bechert, A., Gegenfurtner, S., Amann, C. and Rohrmann, I., Magnetism, J. and Magnetic Materials, 176, 139 (1997).CrossRefGoogle Scholar
12. Armyanov, S., Vitkowa, S. and Blajiev, O., J. Appl. Electrochemistry, 27, 185 (1997).CrossRefGoogle Scholar

Full text views

Full text views reflects PDF downloads, PDFs sent to Google Drive, Dropbox and Kindle and HTML full text views.

Total number of HTML views: 0
Total number of PDF views: 10 *
View data table for this chart

* Views captured on Cambridge Core between September 2016 - 22nd January 2021. This data will be updated every 24 hours.

Hostname: page-component-76cb886bbf-rm8z7 Total loading time: 0.297 Render date: 2021-01-22T20:36:00.679Z Query parameters: { "hasAccess": "0", "openAccess": "0", "isLogged": "0", "lang": "en" } Feature Flags: { "shouldUseShareProductTool": true, "shouldUseHypothesis": true, "isUnsiloEnabled": true, "metricsAbstractViews": false, "figures": false, "newCiteModal": false }

Send article to Kindle

To send this article to your Kindle, first ensure no-reply@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about sending to your Kindle. Find out more about sending to your Kindle.

Note you can select to send to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be sent to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Anisotropic Fracture Behavior of Electroless deposited Ni-P Amorphous Alloy Thin Films
Available formats
×

Send article to Dropbox

To send this article to your Dropbox account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Dropbox.

Anisotropic Fracture Behavior of Electroless deposited Ni-P Amorphous Alloy Thin Films
Available formats
×

Send article to Google Drive

To send this article to your Google Drive account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Google Drive.

Anisotropic Fracture Behavior of Electroless deposited Ni-P Amorphous Alloy Thin Films
Available formats
×
×

Reply to: Submit a response


Your details


Conflicting interests

Do you have any conflicting interests? *