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Ultrafast Imaging of Materials: Exploring the Gap of Space and Time

  • Wayne E. King, Michael Armstrong, Victor Malka, Bryan W. Reed and Antoine Rousse...

Abstract

The materials science community is poised to take advantage of new technologies that add unprecedented time resolution to already existing spatial-resolution capabilities. In the same way that chemists and biologists are using ultrafast optical, photon, and particle techniques to reveal transition pathways, materials scientists can expect to use variations of these methods to probe the most fundamental aspects of complex transient phenomena in materials. The combination of high-spatial-resolution imaging with high time resolution is critical because it enables the observation of specific phenomena that are important to developing fundamental understanding. Such a capability is also important because it enables experiments that are on the same time and length scales as recent high-performance computer simulations. This article describes several new techniques that have great potential for broader application in materials science, including electron, x-ray, and γ-ray imaging.

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1Sorby, H.C.J. Iron & Steel Inst. 30 (1886) p. 140.
2Sorby, H.C.J. Iron & Steel Inst. 31 (1887) p. 255.
3Hirsch, P.B.Horne, R.W. and Whelan, M.J.Philos. Mag. 1 (1956) p. 677.
4Glinec, Y.Faure, J.Dain, L.L.Darbon, S.Hosokai, T.Santos, J.J.Lefebvre, E.Rousseau, J.P.Burgy, F.Mercier, B. and Malka, V.Phys. Rev. Lett. 94 025003 (2005).
5King, W.E.Campbell, G.H.Frank, A.Reed, B.Schmerge, J.F.Siwick, B.J.Stuart, B.C. and Weber, P.M.J. Appl. Phys. 97 111101 (2005).
6Bostanjoglo, O.Adv. Imaging & Electron Phys. 121 (2002) p. 1.
7Dömer, H. and Bostanjoglo, O.Rev. Sci. Instrum. 74 (2003) p. 4369.
8Lobastov, V.A.Srinivasan, R. and Zewail, A.H.Proc. Natl. Acad. Sci. USA 102 (2005) p. 7069.
9Zewail, A.H.Philos. Trans. R. Soc. London Ser. A 363 (2005) p. 315.
10Bostanjoglo, O. and Rosin, T.Phys. Status Solidi A 57 (1980) p. 561.
11Thomas, J.M.Angew. Chem. Int. Ed. 44 (2005) p. 5563.
12Gaffney, K.J.Lindenberg, A.M.Larsson, J.Sokolowski-Tinten, K., Blome, C.Synnergren, O.Sheppard, J.Caleman, C.MacPhee, A.G.Weinstein, D.Lowney, D.P.Allison, T.Matthews, T.Falcone, R.W.Cavalieri, A.L.Fritz, D.M.Lee, S.H.Bucksbaum, P.H.Reis, D.A.Rudati, J.Macrander, A.T.Fuoss, P.H.Kao, C.C.Siddons, D.P.Pahl, R.Moffat, K.Als-Nielsen, J., Duesterer, S.Ischebeck, R.Schlarb, H.Schulte-Schrepping, H., Schneider, J.Linde, D. von der, Hignette, O.Sette, F.Chapman, H.N.Lee, R.W.Hansen, T.N.Wark, J.S.Bergh, M.Huldt, G.Spoel, D. van der, Timneanu, N.Hajdu, J.Akre, R.A.Bong, E.Krejcik, P.Arthur, J.Brennan, S.Luening, K. and Hastings, J.B.Phys. Rev. Lett. 95 125701 (2005).
13Schotte, F.Lim, M.H.Jackson, T.A.Smirnov, A.V.Soman, J.Olson, J.S.Phillips, G.N.Wulff, M. and Anfinrud, P.A.Science 300 (2003) p. 1944.
14Siwick, B.J.Dwyer, J.R.Jordan, R.E. and Miller, R.J.D.Science 302 (2003) p. 1382.
15Siwick, B.J.Dwyer, J.R.Jordan, R.E. and Miller, R.J.D.Chem. Phys. 299 (2004) p. 285.
16Jansen, G.H.Coulomb Interactions in Particle Beams, Vol. 21 (Academic Press, San Diego, CA, 1990) p. 546.
17Liddle, J.A.Blakey, M.I.Bolan, K.Farrow, R.C.Gallatin, G.M.Kasica, R.Katsap, V.Knurek, C.S.Li, J.Mkrtchyan, M.Novembre, A.E.Ocola, L.Orphanos, P.A.Peabody, M.L.Stanton, S.T.Teffeau, K.Waskiewicz, W.K. and Munro, E.J. Vac. Sci. Technol., B 19 (2001) p. 476.
18James, E.M.Browning, N.D.Nicholls, A.W.Kawasaki, M.Xin, Y. and Stemmer, S.J. Electron Microsc. 47 (1998) p. 561.
19Spivak, G.V.Pavlyuchenko, O.P. and Petrov, V.I.Bull. Acad. Sci. USSR 30 (1966) p. 822.
20Minor, A.M.Lilleodden, E.T.Stach, E.A. and Morris, J.W.J. Mater. Res. 19 (2004) p. 176.
21Tan, X.L.He, H. and Shang, J.K.J. Mater. Res. 20 (2005) p. 1641.
22Linac Coherent Light Source (LCSC) home page, www-ssrl.slac.stanford.edu/lcls/ (accessed July 2006).
23“TESLA Technical Design Report, Part V: The X-Ray Free Electron Laser,” edited by G. Materlik and Th. Tschentscher http://tesla.desy.de/new_pages/TDR_CD/PartV/fel.html (accessed July 2006).
24Bloembergen, N.Rev. Mod. Phys. 71 (1999) p. S283.
25Rousse, A.Rischel, C. and Gauthier, J.C.Rev. Mod. Phys. 73 (2001) p. 17.
26Bressler, C. and Chergui, M.Chem. Rev. 104 (2004) p. 1781.
27Rischel, C.Rousse, A.Uschmann, I.Albouy, P.A.Geindre, J.P.Audebert, P.Gauthier, J.C.Forster, E.Martin, J.L. and Antonetti, A.Nature 390 (1997) p. 490.
28Siders, C.W.Cavalleri, A.Sokolowski-Tinten, K., Toth, C.Guo, T.Kammler, M.Hoegen, M.H. von, Wilson, K.R.Linde, D. von der, and Barty, C.P.J.Science 286 (1999) p. 1340.
29Rose-Petruck, C., Jimenez, R.Guo, T.Cavalleri, A.Siders, C.W.Raksi, F.Squier, J.A.Walker, B.C.Wilson, K.R. and Barty, C.P.J.Nature 398 (1999) p. 310.
30Rousse, A.Rischel, C.Fourmaux, S.Uschmann, I.Sebban, S.Grillon, G.Balcou, P.Foster, E.Geindre, J.P.Audebert, P.Gauthier, J.C. and Hulin, D.Nature 410 (2001) p. 65.
31Sokolowski-Tinten, K., Blome, C.Dietrich, C.Tarasevitch, A.Hoegen, M.H. von, Linde, D. von der, Cavalleri, A.Squier, J. and Kammler, M., Phys. Rev. Lett. 87 225701 (2001).
32Cavalleri, A.Toth, C.Siders, C.W.Squier, J.A.Raksi, F.Forget, P. and Kieffer, J.C.Phys. Rev. Lett. 87 237401 (2001).
33Feurer, T.Morak, A.Uschmann, I.Ziener, C.Schwoerer, H.Reich, C.Gibbon, P.Forster, E.Sauerbrey, R.Ortner, K. and Becker, C.R.Phys. Rev. E 65 016412 (2002).
34Sokolowski-Tinten, K., Blome, C.Blums, J.Cavalleri, A.Dietrich, C.Tarasevitch, A.Uschmann, I.Forster, E.Kammler, M.Hornvon-Hoegen, M., and Linde, D. von der, Nature 422 (2003) p. 287.
35Rousse, A.Audebert, P.Geindre, J.P.Fallies, F.Gauthier, J.C.Mysyrowicz, A.Grillon, G. and Antonetti, A.Phys. Rev. E 50 (1994) p. 2200.
36Tajima, T. and Dawson, J.M.Phys. Rev. Lett. 43 (1979) p. 267.
37Kostyukov, I.Kiselev, S. and Pukhov, A.Phys. Plasmas 10 (2003) p. 4818.
38Pukhov, A. and Meyer-ter-Vehn, J., Appl. Phys. B 74 (2002) p. 355.
39Rousse, A.Phuoc, K.T.Shah, R.Pukhov, A.Lefebvre, E.Malka, V.Kiselev, S.Burgy, F.Rousseau, J.P.Umstadter, D. and Hulin, D.Phys. Rev. Lett. 93 135005 (2004).
40Phuoc, K.T.Burgy, F.Rousseau, J.P.Malka, V.Rousse, A.Shah, R.Umstadter, D.Pukhov, A. and Kiselev, S.Phys. Plasmas 12 023101 (2005).
41Chen, Y.-J.Bertolini, L.R.Caporaso, G.J.Chambers, F.W.Cook, E.G.Falabella, S.Goldin, F.J.Guethlein, G.Ho, D.D.-M.McCarrick, J.F.Nelson, S.D.Neurath, R.Paul, A.C.Pincosy, P.A.Poole, B.R.Richardson, R.A.Sampayan, S.Wang, L.-F. and Watson, J.A. presented at the XXI Intl. Linac Conf. (Gyeongju, Korea, August 19–23, 2002).
42Mangles, S.P.D.Murphy, C.D.Najmudin, Z.Thomas, A.G.R.Collier, J.L.Dangor, A.E.Divall, E.J.Foster, P.S.Gallacher, J.G.Hooker, C.J.Jaroszynski, D.A.Langley, A.J.Mori, W.B.Norreys, P.A.Tsung, F.S.Viskup, R.Walton, B.R. and Krushelnick, K.Nature 431 (2004) p. 535.
43Geddes, C.G.R.Toth, C.Tilborg, J. van, Esarey, E.Schroeder, C.B.Bruhwiler, D.Nieter, C.Cary, J. and Leemans, W.P.Nature 431 (2004) p. 538.
44Faure, J.Glinec, Y.Pukhov, A.Kiselev, S.Gordienko, S.Lefebvre, E.Rousseau, J.P.Burgy, F. and Malka, V.Nature 431 (2004) p. 541.
45LaGrange, T.Armstrong, M.A.Boyden, K.R.Brown, C.G.Browning, N.D.Campbell, G.H.Colvin, J.D.DeHope, W.J.Frank, A.M.Gibson, D.J.Hartemann, F.V.Kim, J.S.King, W.E.Pyke, B.J.Reed, B.W.Shirk, M.D.Shuttlesworth, R.M.Stuart, B.C. and Torralva, B.R.Single Shot Dynamic Transmission Electron Microscopy,” Appl. Phys. Lett. 89 044105 (2006).

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Ultrafast Imaging of Materials: Exploring the Gap of Space and Time

  • Wayne E. King, Michael Armstrong, Victor Malka, Bryan W. Reed and Antoine Rousse...

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