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Nanometrology Links State-of-the-Art Academic Research and Ultimate Industry Needs for Technological Innovation

  • Ado Jorio and Mildred S. Dresselhaus
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1.Jorio, A., Dresselhaus, M.S., Dresselhaus, G., Carbon Nanotubes: Advanced Topics in the Synthesis, Structure, Properties and Applications (Vol. 111, Springer Series in Topics in Appl. Phys., Springer-Verlag, Berlin, 2007).
2.First International Workshop on Metrology, Standardization and Industrial Quality of Nanotubes (MSIN07), (Inmetro, Rio de Janeiro, Brazil, June 22, 2007); http://www.inmetro.gov.br/msin07.
3.Third NASA-NIST Workshop on Nanotube Measurements, (NIST, Gaithersburg, September 26–28, 2007); http://polymers.nist.gov/Nanotube3/Workshop3.htm.
4. National Research Council, Condensed-Matter and Materials Physics: The Science of the World Around Us, (The National Academies Press, 2007).
5. National Institute of Standards and Technology, T.M.S. an Engineering Laboratory; http://www.msel.nist.gov/Nanotube2/Carbon\_Nanotubes\_Guide.htm.
6.Second International Workshop on Metrology, Standardization and Industrial Quality of Nanotubes (MSIN08), (Le Corum, Montpellier, France, June 28, 2008); http://www.cnrs-imn.fr/NT08/Satellites.html.
7.First International Workshop on Carbon Nanotube Biology and Medicine (NTBM08), (Le Corum, Montpellier, France, June 28, 2008); http://www.cnrs-imn.fr/NT08/Satellites.html.
8.Lin, Y.-M., “Challenges and Achievements on the Transport Measurements of Carbon Nanotubes,” presented at the First International Forum on Metrology, Standardization and Industrial Quality of Nanotubes. www.inmetro.gov.br/msin07/abstract_Lin-MSIN07.pdf.
9.Hovel, H., De Menech, M., Bodecker, M., Rettig, C., Saalmann, U., andGarcia, M.E., Eur. Phys. J. D. (2007) DOI: 10.1140/epjd/e2007–00226–2. Figure reprinted with permission. ©2007 by EDP Sciences.
10.Freitag, B., Groen, B., Otten, M., andHubert, D., “Novel Developments in High Resolution Electron Microscopy for Ultimate Nanotube Metrology,” presented at the First International Forum on Metrology, Standardization and Industrial Quality of Nanotubes; www.inmetro.gov.br/msin07/abstract_hubert-MSIN07.pdf.
11.Hartschuh, A., Nachrichten aus der Chemie 55 (2007) p. 495. Reprinted with permission.
12.O'Connell, M.J., Bachilo, S.M., Huffman, C.B., Moore, V.C., Strano, M.S., Haroz, E.H., Rialon, K.L., Boul, P.J., Noon, W.H., Kittrell, C., Ma, J., Hauge, R.H., Weisman, R.B., andSmalley, R.E., Science 297 (2002) p. 593. Reprinted with permission from AAAS.
13.Mazoni, M.S.C. and Chacham, H., Appl. Phys. Lett. 76 (2000) 1561. Figure reused with permission. ©2000 American Institute of Physics.
14.Hata, K., Futaba, D.N., Mizuno, K., Namai, T., Yumura, M., andIijima, S., Science 306 (2004) p. 1362. Reprinted with permission from AAAS.

Nanometrology Links State-of-the-Art Academic Research and Ultimate Industry Needs for Technological Innovation

  • Ado Jorio and Mildred S. Dresselhaus

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