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Materials Analysis with High Energy Ion Beams Part II: Channeling and Other Techniques

  • H-J. Gossmann and L.C. Feldman

Abstract

This article discusses uses of high energy ion beam scattering for materials analysis, including channeling, particle induced x-ray emission (PIXE), and nuclear reaction analysis (NRA). These additional capabilities used in conjunction with RBS equipment provide capabilities for crystalline defect studies and light element detection.

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Materials Analysis with High Energy Ion Beams Part II: Channeling and Other Techniques

  • H-J. Gossmann and L.C. Feldman

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