Coherent X-Ray Technique Reveals Interface Structure with Sub-Angstrom Resolution

Maxim Nikiforov

doi:10.1557/mrs2003.8

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Coherent X-Ray Technique Reveals Interface Structure with Sub-Angstrom Resolution

Published online by Cambridge University Press: 31 January 2011

Maxim Nikiforov

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Type: Research/Researchers
Information: MRS Bulletin , Volume 28 , Issue 1: Microelectronics Packaging and Integration , January 2003 , pp. 6

DOI: https://doi.org/10.1557/mrs2003.8 [Opens in a new window]
Copyright: Copyright © Materials Research Society 2003

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Coherent X-Ray Technique Reveals Interface Structure with Sub-Angstrom Resolution

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