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Published online by Cambridge University Press: 29 November 2013
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- Copyright © Materials Research Society 1992
References
1Miller, M.K. and Smith, G.D.W., Atom Probe Microanalysis: Principles and Applications to Materials Problems (Mater. Res. Soc., Pittsburgh, PA, 1989).Google Scholar
2Sakurai, T., Sakai, S., and Pickering, H.W., Atom-Probe Field Ion Microscopy and Its Applications (Academic Press, New York, 1989).Google Scholar
4Müller, E.W. and Tsong, T.T., Field Ion Microscopy, Principles and Applications (Elsevier, New York, 1969).CrossRefGoogle Scholar
5Cerezo, A., Godfrey, T.J., and Smith, G.D.W., Rev. Sci. Instrum. 59 (1988) p. 862.CrossRefGoogle Scholar
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