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Analytical electron tomography

  • Rowan K. Leary (a1) and Paul A. Midgley (a2)

Abstract

This article highlights recent advances in analytical electron tomography (AET), the three-dimensional (3D) extension of conventional nanoanalytical techniques, in which electron energy loss, x-ray spectroscopy, and electron diffraction are combined with tomographic acquisition and reconstruction. Examples from the literature illustrate how new 3D information, gleaned from AET, provides insights into not just morphology and composition, but also the electronic, chemical, and optical properties of materials at the nanoscale. We describe how the “multidimensional” nature of AET leads to “big data” sets, how these can be analyzed optimally, and how AET may develop further.

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1.Leary, R., Midgley, P.A., Thomas, J.M., Acc. Chem. Res. 45, 1782 (2012).
2.Midgley, P.A., Dunin-Borkowski, R.E., Nat. Mater. 8, 271 (2009).
3.Ercius, P., Alaidi, O., Rames, M.J., Ren, G., Adv. Mater. 27, 5638 (2015).
4.Ersen, O., Florea, I., Hirlimann, C., Pham-Huu, C., Mater. Today 18, 395 (2015).
5.Wolf, D., Lubk, A., Röder, F., Lichte, H., Curr. Opin. Solid State Mater. Sci. 17, 126 (2013).
6.Jin-Phillipp, N.Y., Koch, C.T., van Aken, P.A., Ultramicroscopy 111, 1255 (2011).
7.Möbus, G., Inkson, B.J., Appl. Phys. Lett. 79, 1369 (2001).
8.Weyland, M., Midgley, P.A., Inst. Phys. Conf. Ser. (EMAG 2001) 161, 239 (2001).
9.Jarausch, K., Thomas, P., Leonard, D.N., Twesten, R., Booth, C.R., Ultramicroscopy 109, 326 (2009).
10.Yurtsever, A., Weyland, M., Muller, D.A., Appl. Phys. Lett. 89, 151920 (2006).
11.Goris, B., Turner, S., Bals, S., Van Tendeloo, G., ACS Nano 8, 10878 (2014).
12.Egerton, R.F., Electron Energy-Loss Spectroscopy in the Electron Microscope (Springer, New York, 2011).
13.Scott, J., Thomas, P.J., MacKenzie, M., McFadzean, S., Wilbrink, J., Craven, A.J., Nicholson, W.A.P., Ultramicroscopy 108, 1586 (2008).
14.Möbus, G., Doole, R.C., Inkson, B.J., Ultramicroscopy 96, 433 (2003).
15.Saghi, Z., Xu, X., Peng, Y., Inkson, B., Mobus, G., Appl. Phys. Lett. 91, 251906 (2007).
16.Slater, T.J.A., Macedo, A., Schroeder, S.L.M., Burke, M.G., O’Brien, P., Camargo, P.H.C., Haigh, S.J., Nano Lett. 14, 1921 (2014).
17.Burdet, P., Saghi, Z., Filippin, A.N., Borrás, A., Midgley, P.A., Ultramicroscopy 160, 118 (2016).
18.Watanabe, M., Williams, D.B., J. Microsc. 221, 89 (2006).
19.Haberfehlner, G., Orthacker, A., Albu, M., Li, J., Kothleitner, G., Nanoscale 6, 14563 (2014).
20.Kolb, U., Mugnaioli, E., Gorelik, T.E., Cryst. Res. Technol. 46, 542 (2011).
21.Liu, H.H., Schmidt, S., Poulsen, H.F., Godfrey, A., Liu, Z.Q., Sharon, J.A., Huang, X., Science 332, 833 (2011).
22.Eggeman, A.S., Krakow, R., Midgley, P.A., Nat. Commun. 6, 7267 (2015).
23.Nicoletti, O., de la Pena, F., Leary, R.K., Holland, D.J., Ducati, C., Midgley, P.A., Nature 502, 80 (2013).
24.Atre, A.C., Brenny, B.J.M., Coenen, T., García-Etxarri, A., Polman, A., Dionne, J.A., Nat. Nanotechnol. 10, 429 (2015).
25.Collins, S.M., Ringe, E., Duchamp, M., Saghi, Z., Dunin-Borkowski, R.E., Midgley, P.A., ACS Photonics 2, 1628 (2015).
26.Saghi, Z., Benning, M., Leary, R., Macias-Montero, M., Borras, A., Midgley, P.A., Adv. Struct. Chem. Imaging 1, 1 (2015).
27.Leary, R., Saghi, Z., Midgley, P.A., Holland, D.J., Ultramicroscopy 131, 70 (2013).

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