Hostname: page-component-8448b6f56d-t5pn6 Total loading time: 0 Render date: 2024-04-23T14:01:52.577Z Has data issue: false hasContentIssue false

Resonant photoemission spectroscopy of gamma irradiated VO2 films

Published online by Cambridge University Press:  10 April 2018

I.G. Madiba*
Affiliation:
UNESCO-UNISA Africa Chair in Nanosciences/Nanotechnology, College of Graduate Studies, University of South Africa (UNISA), Muckleneuk Ridge, PO Box 392, Pretoria, South Africa. ETH Zurich, Swiss Federal Institute of Technology CH-8057Zurich, Switzerland iThemba LABS-National Research Foundation, 1 Old Faure Road, Somerset West7129, PO Box722, Somerset West, Western Cape Province, South Africa Empa, Swiss Federal Laboratories Materials Science and Technology, CH-8600 Dübendorf, Switzerland
A. Braun
Affiliation:
Empa, Swiss Federal Laboratories Materials Science and Technology, CH-8600 Dübendorf, Switzerland
N. Émond
Affiliation:
Institut National de la Recherche Scientifique (INRS), 1650Blvd. Lionel-Boulet, Varennes, Québec J3X 1S2, Canada
M. Chaker
Affiliation:
Institut National de la Recherche Scientifique (INRS), 1650Blvd. Lionel-Boulet, Varennes, Québec J3X 1S2, Canada
S.I. Tadadjeu
Affiliation:
Department of Electrical, Electronics and Computer Engineering, French South African Institute of Technology/Cape Peninsula University of Technology, Bellville campus, PO Box 1906, Bellville, 7530, South Africa
B.S. Khanyile
Affiliation:
UNESCO-UNISA Africa Chair in Nanosciences/Nanotechnology, College of Graduate Studies, University of South Africa (UNISA), Muckleneuk Ridge, PO Box 392, Pretoria, South Africa. iThemba LABS-National Research Foundation, 1 Old Faure Road, Somerset West7129, PO Box722, Somerset West, Western Cape Province, South Africa
M. Maaza
Affiliation:
UNESCO-UNISA Africa Chair in Nanosciences/Nanotechnology, College of Graduate Studies, University of South Africa (UNISA), Muckleneuk Ridge, PO Box 392, Pretoria, South Africa. iThemba LABS-National Research Foundation, 1 Old Faure Road, Somerset West7129, PO Box722, Somerset West, Western Cape Province, South Africa
Get access

Abstract

Vanadium dioxide thin films are considered as smart functional coatings for thermal shielding, and are attractive as a passive thermal shield for spacecrafts. In space they would, however, be subjected to bombardment by interstellar dust particles and electromagnetic radiation. Materials subjected to irradiation will suffer damages induced by the displacement cascades initiated by nuclear reaction. Such cosmic radiation can severely impact the structure and function of materials. To study this effect in the laboratory, we have deposited VO2 films on silicon wafers and exposed them to γ-radiation of doses up to 100 kGy by using a 60Co nuklid source with 1.17 and 1.33 MeV photon energy. We anticipate that the γ-radiation causes local structural perturbations which can amount to defects with a corresponding change in electronic structure and thermal shielding property. We report on the photo emission spectroscopy of gamma irradiated VO2 thin films.

Type
Articles
Copyright
Copyright © Materials Research Society 2018 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Benkahoul, M., Chaker, M., Margot, J., Haddad, E., Kruzelecky, R., Wong, B., Jamroz, W., Poinas, P., Sol. Energy Mater. Sol. Cells 95, 3504 (2011).CrossRefGoogle Scholar
Haddad, E., Kruzelecky, R., Wong, B., Jamroz, W., Soltani, M., Chaker, M., Poinas, P., Benkahoul, M., SAE Inc. 1, 2575 (2009).Google Scholar
Eyert, V.., Ann. Phys. 11, 650 (2002).3.0.CO;2-K>CrossRefGoogle Scholar
Petrov, G.I., Yakovlev, V.V., Squier, J.A., Opt. Lett. 27, 655 (2002).CrossRefGoogle Scholar
Cavalleri, A., Toth, C., Siders, C.W., Squier, J.A., Raski, F., Forget, P., Kieffer, J.C., Phys. Rev. Lett. 87, 237401 (2001).CrossRefGoogle Scholar
Morin, F.J., Phys. Rev. Lett. 3, 34 (1959)CrossRefGoogle Scholar
Maaza, M., Hamid, D., Simo, A., Kerdja, T., Chaudhary, A. K., Kana Kana, J. B., Opt. Commun. 285, 1193 (2012).CrossRefGoogle Scholar
Maaza, M., Simo, S., Itani, B.D., Kana Kana, J.B., Harti, E.L., Boziane, K., Saboungi, M.L., Doyle, T.B., Lukyanchuk, L., J. Nanopart. Res 16, 2397 (2014).CrossRefGoogle Scholar
Holbert, K.E., Radiation Effects on Materials: Displacement Damage lectures from Nuclear Concepts for the 21st Century course Arizona State University http://www.eas.asu.edu/∼holbert/eee460/RadiationEffectsDamage.pdf (2006).Google Scholar
Doyle, B.L., Displacement Damage Caused by Gamma-rays and Neutrons on Au and Se, SANDIA Report (2014).Google Scholar
Kwon, J., Motta, A.T., Ann.Nuc. Energy 27, 1627 (2000).CrossRefGoogle Scholar
Kinchin, G.H., Pease, R.S., Rep. Prog. Phys. 18, 1 (1955).CrossRefGoogle Scholar
Thompson, D.A., Radiat. Eff 56, 105 (1981).CrossRefGoogle Scholar
Holmes-Siedle, A.G., Adams, L, Handbook of Radiation Effects, Oxford, New York, Oxford University Press (1993).Google Scholar
Case, F.C., Vac, J.. Sci. Technol. A 2, 1509 (1984).Google Scholar
Case, F.C., Vac, J.. Sci. Technol. A 7, 1194 (1989).Google Scholar
Leone, A., Trione, A.M., Junga, F., IEEE Trans. Nucl. Sci. 37, 1739 (1990).CrossRefGoogle Scholar
Lu, T.C., Lin, L. B., Liu, Q., Lu, Y., Feng, X.D., Nucl. Instum/ Methods. Phys. Res., Sect.B, 191 291 (2002).CrossRefGoogle Scholar
Karl, H., Peng, J., Stritzker, B., Mater. Res. Soc. Symp. Proc. 1256 (2010)CrossRefGoogle Scholar
Madiba, I.G., Émond, N., Chaker, M., Thema, F.T.,Tadadjeuc, S.I. c, S.I., Muller, U., Zolliker, P., Braun, A., Kotsedi, L., Maaza, M., 411, 271 (2017).Google Scholar
gullikson, E. M., Henke, B. L., Davis, JC, Interactions-photoabsorption, scattering, transmission and reflection AT E=50-30.000 EV, Z=1-92. Atomic data and nuclear Data Tables 1993, 54:181342.Google Scholar
gullikson, E. M., Henke, B. L., Davis, JC, Interactions-photoabsorption, scattering, transmission and reflection AT E=50-30.000 EV, Z=1-92 (Vol 54, p. 181, 1993). Atomic data and nuclear Data Tables 1993, 55:349-349.Google Scholar
Thompson, A.C., X-Ray Data booklet, Center for X-ray Optics, Lawrence Berkeley National Laboratory, California USA, 2009.Google Scholar