Hostname: page-component-76fb5796d-22dnz Total loading time: 0 Render date: 2024-04-25T15:12:50.632Z Has data issue: false hasContentIssue false

Investigation of Acoustic Cavitation in Aqueous Surfactant Solutions for Cleaning Applications

Published online by Cambridge University Press:  03 May 2016

Mingrui Zhao
Affiliation:
Chemical and Environmental Engineering, University of Arizona, 1133 E. James E. Rogers Way, Tucson, AZ 85721, U.S.A.
Anfal Alobeidli
Affiliation:
Materials Science and Engineering, University of Arizona, 1235 E. James E. Rogers Way, Tucson, AZ 85721, U.S.A.
Xi Chen
Affiliation:
Onda Corporation, 1290 Hammerwood Ave, Sunnyvale, CA 94089, U.S.A.
Petrie Yam
Affiliation:
Onda Corporation, 1290 Hammerwood Ave, Sunnyvale, CA 94089, U.S.A.
Claudio Zanelli
Affiliation:
Onda Corporation, 1290 Hammerwood Ave, Sunnyvale, CA 94089, U.S.A.
Sharyl Maraviov
Affiliation:
PCT Systems Inc., 49000 Milmont Dr, Fremont, CA 94538, U.S.A.
Mona Nagel
Affiliation:
Carl Zeiss, Carl-Zeiss-Strasse 22, 73447 Oberkochen, Germany.
Farhang Shadman
Affiliation:
Chemical and Environmental Engineering, University of Arizona, 1133 E. James E. Rogers Way, Tucson, AZ 85721, U.S.A.
Manish Keswani*
Affiliation:
Materials Science and Engineering, University of Arizona, 1235 E. James E. Rogers Way, Tucson, AZ 85721, U.S.A.
*
*Corresponding author, E-mail: manishk@email.arizona.edu; Fax: +1-520-621-8059
Get access

Abstract

Surfactants are commonly used as additives in cleaning formulations during acoustic cleaning of semiconductor surfaces. Since surfactants are surface active, they can affect cavitation characteristics and, therefore, influence cleaning efficiency and damage to the surface. In this work, stable and transient cavitation pressures were characterized in Triton® X-100 containing aqueous solutions subjected to single frequency and dual-frequency sound fields using acoustic emission measurements. The hydrophone based technique allowed quantitative measurements of the absolute pressure values from stable and transient cavitation fields. The ratio of stable cavitation pressure to transient cavitation pressure under different conditions indicated that surfactants can play an important role in reducing feature damage while maintaining particle removal efficiency. Damage studies conducted on aluminum coated glass samples further confirmed these results.

Type
Articles
Copyright
Copyright © Materials Research Society 2016 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Balachandran, R., Zhao, M., Yam, P., Zanelli, C. and Keswani, M., Microelectron. Eng. 133, 4550 (2015).CrossRefGoogle Scholar
Keswani, M., Raghavan, S. and Deymier, P., Ultrason. Sonochem. 20, 603609 (2013).CrossRefGoogle Scholar
Han, Z., Keswani, M. and Raghavan, S., IEEE Trans. Semicond. Manuf. 26(3), 400405 (2013).CrossRefGoogle Scholar
Ohl, C.-D., Arora, M., Dijkink, R., Janve, V. and Lohse, D., Appl. Phys. Lett. 89, 074102-1074102-3 (2006).CrossRefGoogle Scholar
Leong, T., Collis, J., Manasseh, R., Ooi, A., Novell, A., Bouakaz, A., Ashokkumar, M. and Kentish, S., J. Phys. Chem. C 115, 2431024316 (2011).CrossRefGoogle Scholar
Sunartio, D., Ashokkumar, M. and Grieser, F., J. Am. Chem. Soc. 129, 60316036 (2007).CrossRefGoogle Scholar
Camerotto, E., Brems, S.. Hauptmann, M., Pacco, A., Struyf, H., Mertens, P.W. and De Gendt, S., J. Appl. Phys. 112, 114322-1114322-9 (2012).CrossRefGoogle Scholar
Leong, T., Wu, S., Kentish, S. and Ashokkumar, M., J. Phys. Chem. C 114, 2014120145 (2010).CrossRefGoogle Scholar