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FTIR Ellipsometry Study on RF sputtered Permalloy-Oxide Thin Films
Published online by Cambridge University Press: 13 June 2016
Abstract
The optical properties of RF sputtered polycrystalline permalloy oxide (PyO) thin films were studied in the infrared by variable angle ellipsometry. The dispersion of PyO shows a Lorentzian dispersion peak at 381.5 cm-1. We attribute this peak to the transverse optical phonon of PyO. This peak is consistent with a rocksalt crystal structure for the Ni0.81Fe0.19O1-δ thin films.
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- Copyright © Materials Research Society 2016
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