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Calibrated sub-micron temperature mapping of an operating plasmonic HAMR device by thermoreflectance imaging

Published online by Cambridge University Press:  20 June 2017

Gregory T. Hohensee ,
Dustin Kendig ,
Ella Pek ,
Wan Kuang ,
Kazuaki Yazawa  and
Ali Shakouri
Gregory T. Hohensee*
Affiliation:
Western Digital Corporation, 1250 Reliance Way, Fremont CA94539, U.S.A.
Dustin Kendig
Affiliation:
Microsanj LLC, 3287 Kifer Road, Santa Clara CA95051, U.S.A.
Ella Pek
Affiliation:
Materials Science and Engineering, Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL61801, U.S.A.
Wan Kuang
Affiliation:
Western Digital Corporation, 1250 Reliance Way, Fremont CA94539, U.S.A. Electrical and Computer Engineering, Boise State University, Boise, ID83725, U.S.A.
Kazuaki Yazawa
Affiliation:
Microsanj LLC, 3287 Kifer Road, Santa Clara CA95051, U.S.A. Electrical and Computer Engineering, Purdue University, West Lafayette, IN47907, U.S.A.
Ali Shakouri
Affiliation:
Electrical and Computer Engineering, Purdue University, West Lafayette, IN47907, U.S.A.
*
*(Email: gregory.hohensee@gmail.com)
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Abstract

Thermal characterization of nano-featured devices is a critical challenge for the development of high performance devices. Although far-field thermoreflectance imaging is limited in spatial resolution by the optical diffraction limit, it is more amenable to absolute temperature calibration of plasmonic devices than existing near-field scanning probe tip methods. We have built an advanced thermoreflectance microscope capable of 50 ns time-resolved, diffraction-limited temperature imaging that can account and correct for thermal expansion, sample drift, numerical aperture, and polarization induced variations in the apparent thermoreflectance coefficient of nanoscale structures. We developed a per-pixel transient calibration technique using this microscope to measure the absolute temperature of an operating heat-assisted magnetic recording (HAMR) head, including features as narrow as 200 nm. The resulting temperature information can be used to experimentally validate numerical models in the design process of such plasmonic devices.

Keywords

devicesthermal stressesoptical
Type
Articles
Information
MRS Advances , Volume 2 , Issue 58-59: Nanomaterials , 2017 , pp. 3613 - 3618
Copyright
Copyright © Materials Research Society 2017 

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References

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