Hostname: page-component-8448b6f56d-t5pn6 Total loading time: 0 Render date: 2024-04-24T14:43:10.203Z Has data issue: false hasContentIssue false

Low temperature flash light curing of spray coated zirconium oxide gate dielectric for flexible, fully patterned and low voltage operated organic thin film transistor

Published online by Cambridge University Press:  10 April 2017

Sudipta K. Sarkar*
Affiliation:
Department of Metallurgical Engineering and Materials Science, Indian Institute of Technology Bombay, Mumbai, Maharashtra400076, India.
Dipti Gupta
Affiliation:
Department of Metallurgical Engineering and Materials Science, Indian Institute of Technology Bombay, Mumbai, Maharashtra400076, India.
Get access

Abstract

In this work, we present low temperature flash light based curing of spray coated high-k zirconium oxide (ZrOx) thin film to realize low voltage operated flexible and fully patterned organic thin film transistors (OTFTs). A simple sol-gel technique was followed to prepare ZrOx from a zirconium complex. By spraying the precursor solution onto substrate through shadow mask, a patterned film was obtained. On the other hand subsequent flash light curing of the coated film not only reduced processing time but also allowed us to fabricate device on polymeric flexible substrate. Spectroscopic analysis confirmed formation of ZrOx film from the solution of zirconium complex. Finally as prepared ZrOx was used as gate dielectric layer in OTFT structure to keep operating voltage as low as -3V. Flexible polyethylenetrephthalate (PET) sheet was used as flexible substrate and pentacene was used as organic active layer. Each and every layer was deposited through metal made shadow mask to develop fully patterned OTFT. Field effect mobility and ON/OFF ratio of as fabricated transistor was found to be as high as 1.2 cm2V-1S-1 and 105 respectively.

Type
Articles
Copyright
Copyright © Materials Research Society 2017 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Chan, C. K., Richter, L. J., Dinardo, B., Jaye, C., Conrad, B. R., Ro, H. W., David, S., Fischer, D. A., Delongchamp, D. M., Gundlach, D. J., Chan, C. K., Richter, L. J., Dinardo, B., Jaye, C., Conrad, B. R., Ro, H. W., Germack, D. S., Fischer, D. A., Delongchamp, D. M., and Gundlach, D. J., Appl. Phy. Lett. 96, 133304 (2010).Google Scholar
Mcculloch, I., Heeney, M., Bailey, C., Genevicius, K., Macdonald, I., Shkunov, M., Sparrowe, D., Tierney, S., Wagner, R., Zhang, W., Chabinyc, M. L., Kline, R. J., Mcgehee, M. D., and Toney, M. F., Nat. Mater. 5(4), 328 (2006).Google Scholar
Shukla, D., Nelson, S. F., Freeman, D. C., Rajeswaran, M., Ahearn, W. G., Meyer, D. M., and Carey, J. T., Chem. Mater. 20(24), 7486 (2008).CrossRefGoogle Scholar
Ha, Y., Jeong, S., Wu, J., Kim, M., Dravid, V. P., Facchetti, A., Marks, T. J., Mater, C. D. N., and Mater, N. N., J. Am. Chem. Soc. 132(49), 17426 (2010).CrossRefGoogle Scholar
Co, S., Dielectrics, Z., Wei, Q., You, E., Hendricks, N. R., Briseno, A. L., and Watkins, J. J., ACS Appl. Mater. Inter. 4(5), 2322 (2012).Google Scholar
Baltic, C., Jansen, H., Campitelli, A., and Borghs, S., Org. Electron. 3(2), 65 (2002).Google Scholar
Cho, J. H. O., Lee, J., Xia, Y. U., Kim, B., He, Y., Renn, M. J., Lodge, T. P., and Frisbie, C. D., Nat. Mater. 7(11), 900 (2008).Google Scholar
Park, Y. M., Desai, A., Salleo, A., and Jimison, L., Chem. Mater. 25(13), 2571 (2013).CrossRefGoogle Scholar
Azarova, N. A., Owen, J. W., Mclellan, C. A., Grimminger, M. A., Chapman, E. K., Anthony, J. E., and Jurchescu, O. D., Org. Electron. 11(12), 1960 (2010).Google Scholar
Zheng, Y., Li, S., Yu, X., Zheng, D., and Yu, J., RSC Adv. 4, 16464 (2014).Google Scholar
Khim, D., Baeg, K., Yu, B., Kang, S., and Kang, M., J. Mater. Chem. C. 1, 1500 (2013).CrossRefGoogle Scholar
Coates, J., Encyclopedia about Analytical Chemistry, Interpretation of Infrared Spectra, A Practical Approach. Available at: http://www.spectroscopynow.com/userfiles/sepspec/file/specNOW/eac10815.pdf (accessed 10 January 2017)Google Scholar