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The Proposed Doppler Electron Velocimeter and the Need for Nanoscale Dynamics

  • Phillip L. Reu (a1)

Extract

As engineering challenges grow in the ever-shrinking world of nano-design, methods of making dynamic measurements of nano-materials and systems become more important. The Doppler electron velocimeter (DEV) is a new measurement concept motivated by the increasing importance of nano-dynamics. Nano-dynamics is defined in this context as any phenomenon that causes a dynamically changing phase in an electron beam, and includes traditional mechanical motion, as well as additional phenomena including changing magnetic and electric fields. The DEV is only a theoretical device at this point. This article highlights the importance of pursuing nano-dynamics and presents a case that the electron microscope and its associated optics are a viable test bed to develop this new measurement tool.

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Footnotes

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Sandia is a multiprogram laboratory operated by Sandia Corporation, a Lockheed Martin Company, for the United States Department of Energy's National Nuclear Security Administration under Contract DE-AC04-94AL85000.

Footnotes

References

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1. Gabor, D., “Microscopy by reconstructed wave-fronts,” Proc. Roy. Soc. A, 197, 454, 1949.
2. Tonomura, A., “Applications of electron holography,” Reviews of Modern Physics, 59, 639, 1987.
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5. Hirayam, T., Chen, J., Tanji, T., Tonomura, A., “Dynamic observation of magnetic domains by on-line real-time electron holography,” Ultramicroscopy, 54, 9, 1994.
6. Reprinted from Möllenstedt, G., Lichte, H., “Doppler shift of electron waves,” Proc. 9th International Congress on Electron Microscopy, Toronto, 1978, pp. 178179, with permission from the Microscopy Society of Canada.
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8. Van Dyck, D., Lichte, H., Spence, J.C.H., “Inelastic scattering and holography,” Ultramicroscopy, 81, 197, 2000.
9. Reprinted from Spence, J.C.H., Zou, J.M., “Does electron holography energy-filter?Ultramicroscopy, 69, 185, 1997, used with permission from Elsevier.
10. Reu, P.L., Hansche, B.D., “Widefield laser Doppler vibrometer using high-speed cameras,” 2006 SEM Annual Conference and Exposition on Experimental and Applied Mechanics, 2006.
11. McMorran, B., Perreault, J., Savas, T.A., and Cronin, A., “Diffraction of 0.5 keV electrons from free-standing transmission gratings,” Ultramicroscopy 106 (2006) 356.

The Proposed Doppler Electron Velocimeter and the Need for Nanoscale Dynamics

  • Phillip L. Reu (a1)

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