Microscopy and Microanalysis: Volume 13 -

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Volume 13 - September 2007

Contents

Page 45 of 60

Metallography, History and the Fine Arts

Research Article

A Metallurgical Insight on the Microstructures of Au-Pt Pre-Hispanic Alloys
M Noguez, R Garcia, G Salas, T Robert, J Ramirez
Published online by Cambridge University Press:

05 August 2007, pp. 1116-1117
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Nanoparticulate Materials in Antiquity: The Good, the Bad and the Ugly
L Murr
Published online by Cambridge University Press:

05 August 2007, pp. 1118-1119
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

SEM Examination of the Microstructure Ancient Pottery Samples after Mounting by Pressure Impregnation with a Low Melting Bi-Sn Alloy
J Steele
Published online by Cambridge University Press:

05 August 2007, pp. 1120-1121
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Experimental Minting and Metallographical Analysis of Roman Silver Coins
D Hu, S Nash, S Fleming
Published online by Cambridge University Press:

05 August 2007, pp. 1122-1123
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Mysterious Minerals and Wild West Sapphires: An Example of Scanning Electron Microscopy and Microbeam Chemical Analysis in Undergraduate Research
T Williams, L Walters
Published online by Cambridge University Press:

05 August 2007, pp. 1124-1125
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Failure analysis: Real-world Applications and Case Studies

Research Article

Metallography in Failure Analysis
F Hogue
Published online by Cambridge University Press:

05 August 2007, pp. 1126-1127
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Discoloration of pure Tin (Sn) surface finish caused by surface oxidation
Y-S Yu, H-J Lee, H-J Kim, Y-J Yoon, B-K Kim
Published online by Cambridge University Press:

05 August 2007, pp. 1128-1129
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Scanning Electron Microscopy in Failure Analysis and Aircraft Mishap Investigation
DH Johnson
Published online by Cambridge University Press:

05 August 2007, pp. 1130-1131
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

The Use of Analytical Electron Microscopy for the Complete Characterization of IC Customer Returns
B Tracy, S Li, A Myers, A delRosario, M Sidorov
Published online by Cambridge University Press:

05 August 2007, pp. 1132-1133
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

High Contact-Resistance from Oxygen in Embedding ILD: An Investigation by TEM PEELS
W Qin, A Donovan, D Heleotes, A Elkin, M Vadipour, N Lerner, P Fejes, D Theodore, D Theodore
Published online by Cambridge University Press:

05 August 2007, pp. 1134-1135
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Shock Induced Fracture of SAC Solder Balls Under Tensile Load
R Champaign, K Wiggins Ph. D.
Published online by Cambridge University Press:

05 August 2007, pp. 1136-1137
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

TEM Investigation on the Failure of Laser Components Made from CaF2
S-C Cheng
Published online by Cambridge University Press:

05 August 2007, pp. 1138-1139
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

The Effect of Electrical Discharge Machining on Electro-Deposited Nano-Crystalline Ni Sheet
L-C Lai, J Earthman, W-A Chiou
Published online by Cambridge University Press:

05 August 2007, pp. 1140-1141
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Identification of surface chemical deposits found in failures of reverse osmosis polymeric membranes
J Williard
Published online by Cambridge University Press:

05 August 2007, pp. 1142-1143
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Analysis of Si Substrate Dislocations in IC Devices
A Myers, B Tracy
Published online by Cambridge University Press:

05 August 2007, pp. 1144-1145
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Aberration Correction in the Electron Microscope

Research Article

Aberration Corrected Imaging in the STEM
AR Lupini, S Pennycook
Published online by Cambridge University Press:

05 August 2007, pp. 1146-1147
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Experimental Set-up of an Advanced Hexapole Cs-Corrector
P Hartel, H Müller, S Uhlemann, M Haider
Published online by Cambridge University Press:

05 August 2007, pp. 1148-1149
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

A Status Report on the TEAM Project
U Dahmen
Published online by Cambridge University Press:

05 August 2007, pp. 1150-1151
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Direct Measurement of Aberrations by Diffracted Beam Holography (CHEF)
M Hÿ
Published online by Cambridge University Press:

05 August 2007, pp. 1152-1153
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Combining Spatial and Temporal Resolution in the Dynamic TEM
ND Browning, JA Berger, GH Campbell, JS Kim, WE King, T LaGrange, DJ Masiel, BW Reed, WA Schroeder, JC H Spence, ML Taheri, T Vecchione
Published online by Cambridge University Press:

05 August 2007, pp. 1154-1155
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Page 45 of 60

Microscopy and Microanalysis

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Volume 13 - September 2007

Metallography, History and the Fine Arts

Research Article

A Metallurgical Insight on the Microstructures of Au-Pt Pre-Hispanic Alloys

Nanoparticulate Materials in Antiquity: The Good, the Bad and the Ugly

SEM Examination of the Microstructure Ancient Pottery Samples after Mounting by Pressure Impregnation with a Low Melting Bi-Sn Alloy

Experimental Minting and Metallographical Analysis of Roman Silver Coins

Mysterious Minerals and Wild West Sapphires: An Example of Scanning Electron Microscopy and Microbeam Chemical Analysis in Undergraduate Research

Failure analysis: Real-world Applications and Case Studies

Research Article

Metallography in Failure Analysis

Discoloration of pure Tin (Sn) surface finish caused by surface oxidation

Scanning Electron Microscopy in Failure Analysis and Aircraft Mishap Investigation

The Use of Analytical Electron Microscopy for the Complete Characterization of IC Customer Returns

High Contact-Resistance from Oxygen in Embedding ILD: An Investigation by TEM PEELS

Shock Induced Fracture of SAC Solder Balls Under Tensile Load

TEM Investigation on the Failure of Laser Components Made from CaF2

The Effect of Electrical Discharge Machining on Electro-Deposited Nano-Crystalline Ni Sheet

Identification of surface chemical deposits found in failures of reverse osmosis polymeric membranes

Analysis of Si Substrate Dislocations in IC Devices

Aberration Correction in the Electron Microscope

Research Article

Aberration Corrected Imaging in the STEM

Experimental Set-up of an Advanced Hexapole Cs-Corrector

A Status Report on the TEAM Project

Direct Measurement of Aberrations by Diffracted Beam Holography (CHEF)

Combining Spatial and Temporal Resolution in the Dynamic TEM

Microscopy and Microanalysis

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Volume 13 - September 2007

Metallography, History and the Fine Arts

Research Article

Failure analysis: Real-world Applications and Case Studies

Research Article

Aberration Correction in the Electron Microscope

Research Article