Microscopy and Microanalysis: Volume 24 - Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018)

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018)

INSTRUMENTATION & METHODS

New Instruments

Abstract

ID-Full Field Microscopy of Elastic and Inelastic Scattering with Transmission off-axis Fresnel Zone Plates

Laboratory-based X-ray NanoCT Explores Morphology of a Zebrafish Embryo

Scanning Hard X-Ray Microscopy Based on Be CRLs

Installation of Lau Interferometer into X-Ray Microscope system for Phase-CT Measurement

Development of Laboratory Grating-based X-ray Phase Contrast Microtomography for Improved Pathology

Design Concept for the In Situ Nanoprobe Beamline for the APS Upgrade

Imaging Capabilities, Performance and Applications of the Hard X-ray Nanoprobe Beamline at NSLS-II

Lab-based Nanoscale 3D X-Ray Microscopy for Failure Analysis on Advanced Semiconductors

Developing the XEOL and TR-XEOL at the X-ray Nanoprobe at Taiwan Photon Source

A Scanning Transmission X-Ray Microscope at the PLS: New Detection Modes

First Results from the X-Ray Microscopy Beamline U41-PGM1-XM at BESSY II.

The New HZB X-Ray Microscopy Beamline U41-PGM1-XM at BESSY II.

3D Full-field Transmission X-ray Microscopy Based on Equally Sloped Tomography at Shanghai Synchrotron Radiation Facility

Nanoprobe Endstation with Montel optics and Resolution 50 nm at Taiwan Photon Source

Development of X-ray Micro-CT System using Open Type Microfocus X-ray Source for Rock and Mineral Samples.

Development of laboratory-type soft X-ray microscope, CXRM, in Water-window using LPP light source

Laboratory-size X-ray Microscope using Wolter Mirror Optics and an Electron-impact X-ray Source for Multi-energy Observation

The Diamond I13-2 Transmission X-ray Microscope: Current Status and Future Developments

X-ray Phase Imaging by Two-Beam Interferometry with Full-Field X-ray Microscope and Transmission Grating

The Scanning Laue Nanodiffraction Microscopy at Taiwan Photon Source

Microscopy and Microanalysis

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Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018)

INSTRUMENTATION & METHODS

New Instruments

Abstract