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Zernike Phase Contrast Electron Microscopy with a Spherically Corrected Foil Lens

Published online by Cambridge University Press:  02 July 2010

Dieter Typke
Dieter Typke*
Affiliation:
Life Science Department, Lawrence Berkeley National Laboratory, 1 Cyclotron Road Mailstop Donner, Berkeley, CA 94720, USA
*
Corresponding author. E-mail: DTypke@lbl.gov
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Abstract

A lens system is proposed that not only provides spherical correction of the objective lens by charges that are induced on a thin foil, in the way proposed in a paper by Otto Scherzer [Optik56(2), 133–147, 1980], but also provides Zernike phase contrast by means of an appropriate phase shift of the scattered electrons within the foil. This system has the potential to provide strong phase contrast from very low spatial frequencies to frequencies above 1/(100 pm).

Keywords

Zernike phase contrastspherical correctionfoil lenstransmission electron microscopy
Type
Special Section—Aberration-Corrected Electron Microscopy
Information
Microscopy and Microanalysis , Volume 16 , Issue 4 , August 2010 , pp. 441 - 444
Copyright
Copyright © Microscopy Society of America 2010

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References

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