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X-ray Microanalysis Phase Map on Rare Earth Minerals with a Conventional and an Annular Silicon Drift Detector

Published online by Cambridge University Press:  25 July 2016

Chaoyi Teng ,
Hendrix Demers ,
Nicolas Brodusch ,
Kristian Waters  and
Raynald Gauvin
Chaoyi Teng
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada
Hendrix Demers
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada
Nicolas Brodusch
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada
Kristian Waters
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada
Raynald Gauvin
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 96 - 97
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Weeks, M.E. The discovery of the elements. XVI. The rare earth elements. Journal of Chemical Education (1932) 9(10) p. 1751.Google Scholar
[2] Sheard, E.R., et al., Controls on the concentration of zirconium, niobium, and the rare earth elements in the Thor Lake rare metal deposit, Northwest Territories, Canada. Economic Geology (2012) 107(1) p. 81–104.Google Scholar
[3] Horny, P. Development of a Quantification Method for X-ray Microanalysis with an Electron Microscope 2006.Google Scholar
[4] Teng, C. Characterization of Rare Earth Minerals Extraction Flowsheet with X-ray Microanalysis at High Spatial Resolution, in Materials and Mining Engineering (2015) McGill University.Google Scholar