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X-Ray Emission of Porous Materials In The Scanning Electron Microscope Computed Using Monte Carlo Simulations

Published online by Cambridge University Press:  02 July 2020

Raynald Gauvin
Raynald Gauvin*
Affiliation:
Département de génie mécaniqué, Université de Sherbrooke, Sherbrooke, Quebec, CanadaJ1K 2R1, rgauvin@vulcain.gme.usherb.ca
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Extract

Conventional quantitative X-ray microanalysis in the scanning electron microscope or in the electron microprobe is valid for specimens of bulk homogeneous composition and with flat and polished surfaces. Quantitative methods, using X-ray microanalysis and Monte Carlo simulations of electron trajectories in solids, have been developed for the chemical analysis of spherical inclusions embedded in a matrix and for multilayered specimens. In this paper, the effect of porosity and of the size of the pores are investigated concerning their effect on X-ray emission using Monte Carlo simulation of electron trajectories in solids since porous materials are of great technological importance.

This new Monte Carlo program uses elastic Mott cross-sections to compute electron trajectories and the Joy & Luo modification of the continuous Bethe law of energy loss and the details are given elsewhere. This program assumes that all the pores are spherical and have the same size.

Type
Quantitative Biological and Materials Microanalysis by Electrons and X-Rays
Information
Microscopy and Microanalysis , Volume 3 , Issue S2: Proceedings: Microscopy & Microanalysis '97, Microscopy Society of America 55th Annual Meeting, Microbeam Analysis Society 31st Annual Meeting, Histochemical Society 48th Annual Meeting, Cleveland, Ohio, August 10-14, 1997 , August 1997 , pp. 883 - 884
Copyright
Copyright © Microscopy Society of America 1997

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References

Gauvin, R., Hovington, P. and Drouin, D. (1995), Scanning, Vol. 17, pp. 202–219.10.1002/sca.4950170401CrossRefGoogle Scholar
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