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Visualization of Pure Phase Objects by Amplitude-Division Three Wave Interference

Published online by Cambridge University Press:  02 July 2020

T. Hirayama  and
T. Saito
T. Hirayama
Affiliation:
Japan Fine Ceramics Center, 2-4-1 Mutsuno, Atsuta-kuJAPAN, Nagoya456-8587, JAPAN
T. Saito
Affiliation:
Japan Fine Ceramics Center, 2-4-1 Mutsuno, Atsuta-kuJAPAN, Nagoya456-8587, JAPAN
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Extract

Pure phase objects having low spatial frequency such as electromagnetic fields in a vacuum can be visualized by electron holography or three-wave interference.1,2) Wavefront-division interference using a biprism requires a field-emission electron gun having high spatial coherency. On the other hand, amplitude-division interference using a thin crystal does not need high spatial coherency of electron source, i.e. an ordinary electron microscope with a LaB6 filament is good enough to form lattice fringes of high contrast. This is an advantage of amplitude-division interference.3,4)

We previously reported three-wave interference achieved by using two electron biprisms. Recently, we have realized amplitude-division three-wave interference by using a Si crystal as a splitter of an electron wave. Figure 1 shows the experimental set-up used to form an amplitude-division threewave interference pattern. A thin crystal prepared by ion-milling is installed at the standard specimen position, and a thin carbon film on which latex particles are sticking is placed at the selected area aperture position.

Type
Electron Holography
Information
Microscopy and Microanalysis , Volume 5 , Issue S2: Proceedings: Microscopy & Microanalysis '99, Microscopy Society of America 57th Annual Meeting, Microbeam Analysis Society 33rd Annual Meeting, Portland, Oregon August 1-5, 1999 , August 1999 , pp. 952 - 953
Copyright
Copyright © Microscopy Society of America

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References

1.Tonomura, A., Electron Holography, (Springer, Berlin, 1993).CrossRefGoogle Scholar
2.Hirayama, T. et al., J. Appl. Phys. 8.2 (1997) 522.CrossRefGoogle Scholar
3.Tonomura, A., 14th Symposium of the Society of EM, 77.Google Scholar
4.Ru, Q. et al., Ultramicroscopy, 53. (1994) 1.CrossRefGoogle Scholar
5. We would like to thank Dr. Jun Yuan for his valuable suggestions. This research was supported by NEDO.Google Scholar