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Uses of a STEM Cs-Corrector in Electron Diffractive Imaging

  • C Dwyer (a1), P Hartel (a2), H Muller (a2), M Haider (a2) and AI Kirkland (a1)...

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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

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Uses of a STEM Cs-Corrector in Electron Diffractive Imaging

  • C Dwyer (a1), P Hartel (a2), H Muller (a2), M Haider (a2) and AI Kirkland (a1)...

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