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Understanding your Material Better – Low Voltage Imaging, Analysis and X-ray Mapping - Applications and Points to Consider
Published online by Cambridge University Press: 05 August 2019
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- Low Voltage, Low Energy Electron Microscopy Imaging and Analysis
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- Copyright
- Copyright © Microscopy Society of America 2019
References
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[6]Rasch, R., Stricher, A., Wood, B. and Truss, R. (2014), Low Voltage In-Lens Backscatter SEM Imaging of Natural Fibre Polymers with Organic Surface Treatments, ACMM 23 Australia.Google Scholar
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[11]Matthews, M., Kearns, S., Buse, B., Electron Probe Microanalysis of U and U-alloys. How hard can it be?, AMAS XV - Symposium, Melbourne, Feb, 2019.Google Scholar
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